SARTONI, SANDRO
 Distribuzione geografica
Continente #
NA - Nord America 291
EU - Europa 286
AS - Asia 57
AF - Africa 1
Continente sconosciuto - Info sul continente non disponibili 1
Totale 636
Nazione #
US - Stati Uniti d'America 288
IT - Italia 95
GB - Regno Unito 85
DE - Germania 34
SG - Singapore 22
BE - Belgio 20
IE - Irlanda 18
CN - Cina 14
FR - Francia 12
FI - Finlandia 8
CH - Svizzera 6
HK - Hong Kong 5
JO - Giordania 5
IN - India 3
AT - Austria 2
CA - Canada 2
IL - Israele 2
JP - Giappone 2
KR - Corea 2
DK - Danimarca 1
EG - Egitto 1
EU - Europa 1
GL - Groenlandia 1
HU - Ungheria 1
IR - Iran 1
NO - Norvegia 1
PH - Filippine 1
RS - Serbia 1
SE - Svezia 1
UA - Ucraina 1
Totale 636
Città #
Southend 77
Chandler 76
Turin 34
Houston 25
Brussels 20
Council Bluffs 19
Dublin 18
Princeton 18
Ann Arbor 17
Singapore 17
Boardman 16
Berlin 14
Milan 12
Torino 10
Bremen 8
Ashburn 7
Rome 7
Fremont 6
Helsinki 6
Bern 4
Camisano Vicentino 3
Dallas 3
Falls Church 3
Wilmington 3
Woodbridge 3
Beijing 2
Cagliari 2
Collegno 2
Cossonay 2
Duncan 2
Fairfield 2
Hamburg 2
Hangzhou 2
Hausleiten 2
Lappeenranta 2
Mcallen 2
Menlo Park 2
Mumbai 2
Palermo 2
Pisa 2
Romainville 2
San Donato Milanese 2
Santa Clara 2
Seattle 2
Tokyo 2
Andover 1
Ardabil 1
Augusta 1
Belgrade 1
Cadoneghe 1
Casal Velino 1
Central 1
Changsha 1
Corleone 1
Giza 1
Lake Forest 1
Legnano 1
Lissone 1
Los Angeles 1
Manila 1
Miami 1
Montréal 1
Nuuk 1
Phoenix 1
Piscataway 1
Redmond 1
Saarlouis 1
San Mateo 1
Seoul 1
Springfield 1
Taastrup 1
Tappahannock 1
Trondheim 1
Valparaiso 1
Vicenza 1
Totale 496
Nome #
In-field Functional Test of CAN Bus Controllers 92
New Perspectives on Core In-field Path Delay Test 92
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries 88
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement 85
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs 80
Recent Trends and Perspectives on Defect-Oriented Testing 63
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries 57
New Techniques to Detect and Mitigate Aging Effects in Advanced Semiconductor Technologies 44
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers 43
Evaluating the Impact of Aging on Path-Delay Self-Test Libraries 15
Self-Test Library Generation for In-field Test of Path Delay faults 13
Totale 672
Categoria #
all - tutte 2.881
article - articoli 298
book - libri 0
conference - conferenze 2.316
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 5.495


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202010 0 0 0 0 0 0 0 0 0 0 0 10
2020/202187 15 4 0 3 1 4 9 21 9 6 10 5
2021/2022146 22 11 4 10 4 0 2 6 5 6 13 63
2022/2023246 28 32 22 29 29 29 10 19 24 3 9 12
2023/202490 4 13 8 7 8 16 9 5 3 3 9 5
2024/202593 5 64 12 12 0 0 0 0 0 0 0 0
Totale 672