SARTONI, SANDRO
 Distribuzione geografica
Continente #
EU - Europa 262
NA - Nord America 246
AS - Asia 25
AF - Africa 1
Continente sconosciuto - Info sul continente non disponibili 1
Totale 535
Nazione #
US - Stati Uniti d'America 243
GB - Regno Unito 85
IT - Italia 85
DE - Germania 34
IE - Irlanda 18
FR - Francia 12
BE - Belgio 8
CH - Svizzera 6
FI - Finlandia 6
CN - Cina 5
HK - Hong Kong 5
JO - Giordania 5
IN - India 3
AT - Austria 2
CA - Canada 2
IL - Israele 2
JP - Giappone 2
DK - Danimarca 1
EG - Egitto 1
EU - Europa 1
GL - Groenlandia 1
HU - Ungheria 1
IR - Iran 1
NO - Norvegia 1
PH - Filippine 1
RS - Serbia 1
SE - Svezia 1
SG - Singapore 1
UA - Ucraina 1
Totale 535
Città #
Southend 77
Chandler 76
Turin 32
Houston 25
Dublin 18
Princeton 18
Ann Arbor 17
Council Bluffs 16
Berlin 14
Milan 11
Torino 10
Bremen 8
Brussels 8
Rome 7
Ashburn 6
Fremont 6
Boardman 5
Helsinki 5
Bern 4
Camisano Vicentino 3
Dallas 3
Falls Church 3
Wilmington 3
Woodbridge 3
Beijing 2
Cagliari 2
Collegno 2
Cossonay 2
Duncan 2
Fairfield 2
Hamburg 2
Hangzhou 2
Hausleiten 2
Mcallen 2
Menlo Park 2
Mumbai 2
Palermo 2
Romainville 2
San Donato Milanese 2
Seattle 2
Tokyo 2
Andover 1
Ardabil 1
Augusta 1
Belgrade 1
Cadoneghe 1
Casal Velino 1
Central 1
Changsha 1
Giza 1
Lake Forest 1
Lappeenranta 1
Legnano 1
Lissone 1
Los Angeles 1
Manila 1
Miami 1
Montréal 1
Nuuk 1
Phoenix 1
Redmond 1
Saarlouis 1
San Mateo 1
Taastrup 1
Tappahannock 1
Trondheim 1
Valparaiso 1
Vicenza 1
Totale 439
Nome #
In-field Functional Test of CAN Bus Controllers 87
New Perspectives on Core In-field Path Delay Test 84
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries 83
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement 76
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs 74
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries 51
Recent Trends and Perspectives on Defect-Oriented Testing 50
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers 36
New Techniques to Detect and Mitigate Aging Effects in Advanced Semiconductor Technologies 24
Totale 565
Categoria #
all - tutte 2.131
article - articoli 189
book - libri 0
conference - conferenze 1.773
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 4.093


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202010 0 0 0 0 0 0 0 0 0 0 0 10
2020/202187 15 4 0 3 1 4 9 21 9 6 10 5
2021/2022146 22 11 4 10 4 0 2 6 5 6 13 63
2022/2023246 28 32 22 29 29 29 10 19 24 3 9 12
2023/202476 4 13 8 7 8 16 9 5 3 3 0 0
Totale 565