SARTONI, SANDRO
 Distribuzione geografica
Continente #
EU - Europa 159
NA - Nord America 37
AS - Asia 10
Continente sconosciuto - Info sul continente non disponibili 1
Totale 207
Nazione #
IT - Italia 55
GB - Regno Unito 46
US - Stati Uniti d'America 35
CZ - Repubblica Ceca 19
DE - Germania 13
IE - Irlanda 9
RU - Federazione Russa 6
FR - Francia 4
HK - Hong Kong 4
CA - Canada 2
IL - Israele 2
IR - Iran 2
BE - Belgio 1
EU - Europa 1
FI - Finlandia 1
GR - Grecia 1
HU - Ungheria 1
NL - Olanda 1
SE - Svezia 1
SG - Singapore 1
TW - Taiwan 1
UA - Ucraina 1
Totale 207
Città #
Southend 46
Torino 16
Turin 13
Bremen 9
Chandler 9
Dublin 9
Milan 5
Fremont 4
Houston 4
Basking Ridge 3
Ann Arbor 2
Central 2
Duncan 2
Palo Alto 2
San Donato Milanese 2
San Giorgio 2
Toronto 2
Amsterdam 1
Camisano Vicentino 1
Collegno 1
Columbus 1
Council Bluffs 1
Giv‘atayim 1
Hamburg 1
Helsinki 1
New York 1
Pordenone 1
Ramat Gan 1
San Mateo 1
Singapore 1
Suzzara 1
Viterbo 1
Wilmington 1
Woodbridge 1
Totale 149
Nome #
In-field Functional Test of CAN Bus Controllers, file e384c431-fc15-d4b2-e053-9f05fe0a1d67 72
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs, file e384c432-744b-d4b2-e053-9f05fe0a1d67 53
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement, file e384c433-fc0e-d4b2-e053-9f05fe0a1d67 26
New Techniques to Detect and Mitigate Aging Effects in Advanced Semiconductor Technologies, file bbd3891e-df6b-4a20-86a9-63fb878f4290 14
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries, file e384c434-ce25-d4b2-e053-9f05fe0a1d67 10
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers, file 2be6f881-30fd-4064-8404-321887a4d5d4 6
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries, file e384c434-ed15-d4b2-e053-9f05fe0a1d67 6
Recent Trends and Perspectives on Defect-Oriented Testing, file 9f026920-2439-410b-b613-af7250a5fb72 5
In-field Functional Test of CAN Bus Controllers, file e384c432-0e89-d4b2-e053-9f05fe0a1d67 4
New Techniques to Detect and Mitigate Aging Effects in Advanced Semiconductor Technologies, file a387e0d0-83f4-4124-b965-d3d0b556a085 3
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs, file e384c432-3672-d4b2-e053-9f05fe0a1d67 3
New Perspectives on Core In-field Path Delay Test, file 02d02db9-831d-49c3-a432-0fe9b07320c1 2
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement, file e384c433-fc0f-d4b2-e053-9f05fe0a1d67 2
Recent Trends and Perspectives on Defect-Oriented Testing, file 138d8101-4ed3-481a-8355-7c634e02664a 1
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries, file e384c434-ce26-d4b2-e053-9f05fe0a1d67 1
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries, file e384c434-ed16-d4b2-e053-9f05fe0a1d67 1
Totale 209
Categoria #
all - tutte 538
article - articoli 30
book - libri 0
conference - conferenze 387
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 955


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20204 0 0 0 0 0 0 0 0 0 0 0 4
2020/202155 12 4 2 2 0 6 7 4 2 4 9 3
2021/202274 5 5 4 10 3 0 3 4 5 6 14 15
2022/202356 8 2 2 5 15 18 2 3 1 0 0 0
2023/202420 0 2 0 0 2 4 6 4 1 1 0 0
Totale 209