Archivio Istituzionale della RicercaVENINI, FEDERICO
VENINI, FEDERICO
Dipartimento di Automatica e Informatica
039035
Industrial best practice: cases of study by automotive chip- makers
2021 Abbati, L. Degli; Ullmann, R.; Paganini, G.; Coppetta, M.; Zaia, L.; Huard, V.; Montfort, O.; Cantoro, R.; Insinga, G.; Venini, F.; Calao, P.; Bernardi, P.
A Comprehensive Methodology for Stress Procedures Evaluation and Comparison for Burn-In of Automotive SoC
2017 Bernardi, Paolo; Appello, Davide; Giacopelli, Giampaolo; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Rabbi, Christian; Restifo, Marco; Ruberg, Priit; Sanchez, Ernesto; Villa, Claudio Maria; Venini, Federico
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller
2017 Bernardi, Paolo; Cantoro, Riccardo; Gianotto, L.; Restifo, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; Venini, Federico; Appello, D.
Robustness in Automotive Electronics: an industrial overview of major concerns
2017 Backhausen, Ulrich; Ballan, Oscar; Bernardi, Paolo; Luca, Sergio De; Henzler, Julie; Kern, Thomas; Piumatti, Davide; Rabenalt, Thomas; Ramamoorthy, Krishnapriya Chakiat; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro; Ullmann, Rudolf; Venini, Federico; Wiesner, Robert
Faster-than-at-speed execution of functional programs: an experimental analysis
2016 Bernardi, Paolo; Bosio, Alberto; Natale, Giorgio Di; Guerriero, Andrea; Venini, Federico
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Industrial best practice: cases of study by automotive chip- makers / Abbati, L.D., Ullmann, R., Paganini, G., Coppetta, M., Zaia, L., Huard, V., Montfort, O., Cantoro, R., Insinga, G., Venini, F., Calao, P., Bernardi, P.. - (2021), pp. 1-6. (2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 06-08 October 2021) [10.1109/DFT52944.2021.9568350]. | 1-gen-2021 | Paganini, G.Cantoro, R.Insinga, G.Venini, F.Calao, P.Bernardi, P. + | Industrial_best_practice_cases_of_study_by_automotive_chip-_makers.pdf |
| A Comprehensive Methodology for Stress Procedures Evaluation and Comparison for Burn-In of Automotive SoC / Bernardi, P., Appello, D., Giacopelli, G., Motta, A., Pagani, A., Pollaccia, G., Rabbi, C., Restifo, M., Ruberg, P., Sanchez, E., Villa, C.M., Venini, F.. - (2017). (Design, Automation and Test in Europe Conference and Exhibition (DATE2017) ). | 1-gen-2017 | BERNARDI, PAOLORESTIFO, MARCOSanchez, ErnestoVENINI, FEDERICO + | - |
| A DMA and CACHE-based stress schema for burn-in of automotive microcontroller / Bernardi, P., Cantoro, R., Gianotto, L., Restifo, M., SANCHEZ SANCHEZ, E.E., Venini, F., Appello, D.. - STAMPA. - (2017), pp. 1-6. (2017 18th IEEE Latin American Test Symposium (LATS) Bogota (CO) 13-15 March 2017) [10.1109/LATW.2017.7906767]. | 1-gen-2017 | BERNARDI, PAOLOCANTORO, RICCARDORESTIFO, MARCOSANCHEZ SANCHEZ, EDGAR ERNESTOVENINI, FEDERICO + | - |
| Robustness in Automotive Electronics: an industrial overview of major concerns / Backhausen, U., Ballan, O., Bernardi, P., Luca, S.D., Henzler, J., Kern, T., Piumatti, D., Rabenalt, T., Ramamoorthy, K.C., SANCHEZ SANCHEZ, E.E., Sansonetti, A., Ullmann, R., Venini, F., Wiesner, R.. - (2017). (23rd IEEE International Symposium on On-Line Testing and Robust System Design ). | 1-gen-2017 | BERNARDI, PAOLOPIUMATTI, DAVIDESANCHEZ SANCHEZ, EDGAR ERNESTOVENINI, FEDERICO + | - |
| Faster-than-at-speed execution of functional programs: an experimental analysis / Bernardi, P., Bosio, A., Natale, G.D., Guerriero, A., Venini, F.. - (2016). (IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) ). | 1-gen-2016 | BERNARDI, PAOLOGUERRIERO, ANDREAVENINI, FEDERICO + | - |