MIRABELLA, NUNZIO
 Distribuzione geografica
Continente #
EU - Europa 248
NA - Nord America 219
AS - Asia 87
SA - Sud America 1
Totale 555
Nazione #
US - Stati Uniti d'America 209
IT - Italia 82
GB - Regno Unito 41
SG - Singapore 34
DE - Germania 32
CN - Cina 22
IE - Irlanda 18
BE - Belgio 15
FR - Francia 12
CH - Svizzera 11
CA - Canada 10
RU - Federazione Russa 8
FI - Finlandia 7
ID - Indonesia 7
TR - Turchia 7
BG - Bulgaria 6
HK - Hong Kong 6
JO - Giordania 5
UA - Ucraina 5
AT - Austria 4
IN - India 4
NL - Olanda 4
KR - Corea 2
BR - Brasile 1
DK - Danimarca 1
ES - Italia 1
NO - Norvegia 1
Totale 555
Città #
Chandler 34
Southend 33
Turin 30
Singapore 25
Houston 21
Milan 19
Dublin 18
Boardman 17
Brussels 15
Council Bluffs 15
Princeton 14
Berlin 8
Ann Arbor 7
Ashburn 7
Istanbul 7
Jakarta 7
Rome 7
Santa Clara 7
Toronto 7
Helsinki 6
Sofia 6
Zurich 6
Baotou 5
Bern 5
Bremen 4
Essen 4
Frankfurt am Main 4
Mcallen 4
Redmond 4
Amsterdam 3
Dallas 3
Los Angeles 3
Settimo Torinese 3
Basking Ridge 2
Beijing 2
Bologna 2
Chennai 2
Edinburgh 2
Hangzhou 2
Hausleiten 2
Lake Forest 2
Menlo Park 2
Padova 2
Palermo 2
Pescara 2
Reggio Calabria 2
San Jose 2
Seattle 2
Vienna 2
Wilmington 2
Americana 1
Andria 1
Borgosesia 1
Carignano 1
Delhi 1
Fairfield 1
Falls Church 1
Guangzhou 1
Hamburg 1
Krimpen Aan Den Ijssel 1
Lappeenranta 1
Las Vegas 1
Lissone 1
Marseille 1
Montréal 1
Nanjing 1
Ottawa 1
Otzberg 1
Shanghai 1
St Petersburg 1
Trondheim 1
Trumbull 1
Valdagno 1
Vigevano 1
Washington 1
Woodbridge 1
Yubileyny 1
Totale 419
Nome #
Comparing different solutions for testing resistive defects in low-power SRAMs 105
Targeting different defect-oriented fault models in IC testing: an experimental approach 96
Testing single via related defectsin digital VLSI designs 87
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells 80
Recent Trends and Perspectives on Defect-Oriented Testing 68
On the test of single via related defects in digital VLSI designs 66
A comparative overview of ATPG flows targeting traditional and cell-aware fault models 65
New techniques for quality and reliability enhancement in electronic systems 13
Totale 580
Categoria #
all - tutte 2.207
article - articoli 630
book - libri 0
conference - conferenze 1.531
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 4.368


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022166 0 0 50 7 6 3 1 3 14 57 13 12
2022/2023156 4 12 24 13 22 22 8 9 15 3 15 9
2023/2024124 8 5 8 16 10 16 19 9 2 6 12 13
2024/2025134 7 46 20 52 9 0 0 0 0 0 0 0
Totale 580