MUSOLINO, FRANCESCO

MUSOLINO, FRANCESCO  

Dipartimento di Elettronica e Telecomunicazioni  

003261  

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Citazione Data di pubblicazione Autori File
A critical assessment of the TEM cell IC susceptibility test method / Fiori, Franco; Musolino, Francesco; Crovetti, Paolo Stefano. - (2002), pp. 499-502. ((Intervento presentato al convegno EMC Europe 2002 : International Symposium on Electromagnetic Compatibility tenutosi a Sorrento (ITA) nel September 9-13, 2002. 1-gen-2002 FIORI, FrancoMUSOLINO, FRANCESCOCROVETTI, Paolo Stefano -
A new technique for the measurement of IC susceptibility to electrical fast transient / Fiori, Franco; Musolino, Francesco. - 1:(2004), pp. 147-150. ((Intervento presentato al convegno International Symposium on Electromagnetic Compatibility nel sept.. 1-gen-2004 FIORI, FrancoMUSOLINO, FRANCESCO -
A new technique for the measurements of IC susceptibility to electrical fast transient / Fiori, Franco; Musolino, Francesco. - (2004), pp. 147-150. ((Intervento presentato al convegno EMC Europe 2004 - International symposium on electromagnetic compatibility tenutosi a Eindhoven - Olanda nel September 6 -10, 2004. 1-gen-2004 FIORI, FrancoMUSOLINO, FRANCESCO -
Analysis of EME produced by a microcontroller operation / Fiori, Franco; Musolino, Francesco. - (2001), pp. 341-345. ((Intervento presentato al convegno Int. Conf. on Design, Automation and test in Europe (DATE 01) tenutosi a Munich (Germany) nel Mar. 2001. 1-gen-2001 FIORI, FrancoMUSOLINO, FRANCESCO -
breaking the boundaries between analogue and digital / Crovetti, P. S.; Musolino, F.; Aiello, O.; LEITE CORREIA DE TOLEDO, PEDRO FILIPE; Rubino, Roberto. - In: ELECTRONICS LETTERS. - ISSN 0013-5194. - STAMPA. - 55:12(2019), pp. 672-673. [10.1049/el.2019.1622] 1-gen-2019 P. S. CrovettiF. MusolinoO. AielloLEITE CORREIA DE TOLEDO, PEDRO FILIPERUBINO, ROBERTO ELL-2019-1622-RAD FINAL.pdf
Chip-Level Design Constraints to Comply With Conducted Electromagnetic Emission Specifications / Musolino, Francesco; VILLAVICENCIO AREVALO, YAMARITA DEL CARMEN; Fiori, Franco. - In: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. - ISSN 0018-9375. - STAMPA. - 54:5(2012), pp. 1137-1146. [10.1109/TEMC.2012.2195665] 1-gen-2012 MUSOLINO, FRANCESCOVILLAVICENCIO AREVALO, YAMARITA DEL CARMENFIORI, Franco eme_micro_pub.pdf
Comparative measurements and analysis of electromagnetic emissions of synchronous and asynchronous processors / Gregoretti, Francesco; Andrikos, Nikolaos; Musolino, Francesco. - (2008), pp. 202-207. ((Intervento presentato al convegno MIPRO 2008 31st International Convention on Information and Communication Technology and Electronics tenutosi a Opatija, Croatia nel May 26-30, 2008. 1-gen-2008 GREGORETTI, FrancescoANDRIKOS, NIKOLAOSMUSOLINO, FRANCESCO -
Comparison of IC conducted emission measurement methods / Fiori, Franco; Musolino, Francesco. - (2001), pp. 319-322. ((Intervento presentato al convegno IEEE Int. Conf. on Electromagnetics in Advanced Applications (ICEAA) tenutosi a torino (IT) nel sept. 2001. 1-gen-2001 FIORI, FrancoMUSOLINO, FRANCESCO -
Comparison of IC conducted measurement methods / Fiori, Franco; Musolino, Francesco. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 52:(2003), pp. 839-845. [10.1109/TIM.2003.814685] 1-gen-2003 FIORI, FrancoMUSOLINO, FRANCESCO comparison.pdf
Correlation between building block power supply currents and conducted emission of digital ICs / Musolino, Francesco; Fiori, Franco. - 1:(2004), pp. 396-399. ((Intervento presentato al convegno International Symposium on Electromagnetic Compatibility nel sept.. 1-gen-2004 MUSOLINO, FRANCESCOFIORI, Franco -
Digital Suppression of EMI-Induced Errors in a Baseband Acquisition Front-End including Off-the-Shelf, EMI-Sensitive Operational Amplifiers / Crovetti, PAOLO STEFANO; Musolino, Francesco. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 10:17(2021), p. 2096. [10.3390/electronics10172096] 1-gen-2021 Paolo CrovettiFrancesco Musolino electronics-10-02096.pdf
EFT Characterization of ICs / Musolino, Francesco. - (2007), pp. 163-167. ((Intervento presentato al convegno EMC Compo 2007 - 6th International Workshop on Electromagnetic Compatibility of Integrated Circuits tenutosi a Torino, Italy nel November 24-28, 2007. 1-gen-2007 MUSOLINO, FRANCESCO -
Electrical Model of a Microcontroller for EMC Analysis / VILLAVICENCIO AREVALO, YAMARITA DEL CARMEN; Musolino, Francesco; Fiori, Franco. - (2009), pp. 71-74. ((Intervento presentato al convegno EMC Compo 2009 tenutosi a Toulouse nel Nov. 2009. 1-gen-2009 VILLAVICENCIO AREVALO, YAMARITA DEL CARMENMUSOLINO, FRANCESCOFIORI, Franco YVFMFF_r.pdf
Electrical Model of Microcontrollers for the Prediction of Electromagnetic Emissions / Villavicencio, Y.; Musolino, Francesco; Fiori, Franco. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - STAMPA. - 19:7(2011), pp. 1205-1217. [10.1109/TVLSI.2010.2047281] 1-gen-2011 MUSOLINO, FRANCESCOFIORI, Franco + uc_emc_model.pdf
Esercizi di elettronica analogica / Musolino, Francesco. - (2007). 1-gen-2007 MUSOLINO, FRANCESCO -
FPGA-Based Relaxation D/A Converters With Parasitics-Induced Error Suppression and Digital Self-Calibration / Rubino, Roberto; Crovetti, Paolo S.; Musolino, Francesco. - In: IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS. - ISSN 1549-8328. - STAMPA. - 68:6(2021), pp. 2494-2507. [10.1109/TCSI.2021.3064419] 1-gen-2021 Roberto RubinoPaolo S. CrovettiFrancesco Musolino ReDAC_R2.pdfCrovetti-FPGA.pdf
A Framework for the Development and Monitoring of Digital Control in Power Converters / Crovetti, P.; Gregoretti, F.; Musolino, F.; Usmonov, M.. - ELETTRONICO. - (2020), pp. 76-81. ((Intervento presentato al convegno 7th International Conference on Electrical and Electronics Engineering, ICEEE 2020 tenutosi a tur nel 2020 [10.1109/ICEEE49618.2020.9102523]. 1-gen-2020 Crovetti P.Gregoretti F.Musolino F.Usmonov M. ICEEE_rp017_E162.pdfE162-latex.pdf
Identification of integrated circuits conducted emission limits for automotive applications / Musolino, Francesco; Fiori, Franco; Franco, Schinco; PIERO DE LA, Pierre. - (2005). ((Intervento presentato al convegno SAE 2005 World Congress & Exhibition tenutosi a Detroit, Michigan, USA nel April 11-14, 2005. 1-gen-2005 MUSOLINO, FRANCESCOFIORI, Franco + -
Influence of the 1 Ω method test setup on IC conducted emission measurements / Fiori, Franco; Musolino, Francesco. - (2002), pp. 289-292. ((Intervento presentato al convegno 16th International Symposium and Exhibition on Electromagnetic Compatibility tenutosi a Wroclaw, Poland nel June 25-28, 2002. 1-gen-2002 FIORI, FrancoMUSOLINO, FRANCESCO -
Influence of the IEC 61967 Test Board on IC Electromagnetic Emissions / VILLAVICENCIO AREVALO, YAMARITA DEL CARMEN; Musolino, Francesco; Fiori, Franco; D., Pandini. - 20th:(2009), pp. 281-284. ((Intervento presentato al convegno EMC Zurich 2009 tenutosi a Zurich, Switzerland nel January 12 - January 16, 2009 [10.1109/EMCZUR.2009.4783445]. 1-gen-2009 VILLAVICENCIO AREVALO, YAMARITA DEL CARMENMUSOLINO, FRANCESCOFIORI, Franco + Musolino-Influence.pdf