Archivio Istituzionale della RicercaGIOVINAZZO, CECILIA
GIOVINAZZO, CECILIA
Dipartimento di Elettronica e Telecomunicazioni
039912
Analog Control of Retainable Resistance Multistates in HfO2 Resistive-Switching Random Access Memories (ReRAMs)
2019 Giovinazzo, Cecilia; Sandrini, Jury; Shahrabi, Elmira; Celik, Oguz Tolga; Leblebici, Yusuf; Ricciardi, Carlo
Resistive Switching in Sub-micrometric ZnO polycrystalline Films
2019 Conti, Daniele; Laurenti, Marco; Porro, Samuele; Giovinazzo, Cecilia; Bianco, Stefano; Fra, Vittorio; Chiolerio, Alessandro; Pirri, Candido Fabrizio; Milano, Gianluca; Ricciardi, Carlo
Switching Kinetics Control of W-Based ReRAM Cells in Transient Operation by Interface Engineering
2019 Shahrabi, E.; Giovinazzo, C.; Hadad, M.; Lagrange, T.; Ramos, M.; Ricciardi, C.; Leblebici, Y.
Effects of single-pulse Al2O3 insertion in TiO2 oxide memristors by low temperature ALD
2018 Giovinazzo, C.; Ricciardi, C.; Pirri, C. F.; Chiolerio, A.; Porro, S.
Tests of SEU effects of circuits developed in 130 nm CMOS technology
2015 Calvo, D.; De Remigis, P.; Giovinazzo, Cecilia; Mazza, G.; Olave, ELIAS JONHATAN; Silvestrin, L.; Wheadon, R.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Analog Control of Retainable Resistance Multistates in HfO2 Resistive-Switching Random Access Memories (ReRAMs) / Giovinazzo, C., Sandrini, J., Shahrabi, E., Celik, O.T., Leblebici, Y., Ricciardi, C.. - In: ACS APPLIED ELECTRONIC MATERIALS. - ISSN 2637-6113. - ELETTRONICO. - 1:6(2019), pp. 900-909. [10.1021/acsaelm.9b00094] | 1-gen-2019 | Giovinazzo, CeciliaSandrini, JuryRicciardi, Carlo + | 2019_Cecilia_HfOx_ACSaelm.pdf |
| Resistive Switching in Sub-micrometric ZnO polycrystalline Films / Conti, D., Laurenti, M., Porro, S., Giovinazzo, C., Bianco, S., Fra, V., Chiolerio, A., Pirri, C.F., Milano, G., Ricciardi, C.. - In: NANOTECHNOLOGY. - ISSN 0957-4484. - ELETTRONICO. - 30:6(2019). [10.1088/1361-6528/aaf261] | 1-gen-2019 | Conti, DanieleLaurenti, MarcoPorro, SamueleGIOVINAZZO, CECILIABianco, StefanoFRA, VITTORIOChiolerio, AlessandroPirri, Candido FabrizioMilano, GianlucaRicciardi, Carlo | 2019_daniele_Nano-iop.pdf |
| Switching Kinetics Control of W-Based ReRAM Cells in Transient Operation by Interface Engineering / Shahrabi, E., Giovinazzo, C., Hadad, M., Lagrange, T., Ramos, M., Ricciardi, C., Leblebici, Y.. - In: ADVANCED ELECTRONIC MATERIALS. - ISSN 2199-160X. - ELETTRONICO. - 5:8(2019), p. 1800835. [10.1002/aelm.201800835] | 1-gen-2019 | Giovinazzo C.Ricciardi C. + | 2019_Elmira_Wox_Adv_Elect_Mat.pdf |
| Effects of single-pulse Al2O3 insertion in TiO2 oxide memristors by low temperature ALD / Giovinazzo, C., Ricciardi, C., Pirri, C.F., Chiolerio, A., Porro, S.. - In: APPLIED PHYSICS. A, MATERIALS SCIENCE & PROCESSING. - ISSN 0947-8396. - 124:10(2018). [10.1007/s00339-018-2112-5] | 1-gen-2018 | Giovinazzo, C.Ricciardi, C.Pirri, C. F.Chiolerio, A.Porro, S. | - |
| Tests of SEU effects of circuits developed in 130 nm CMOS technology / Calvo, D., De Remigis, P., Giovinazzo, C., Mazza, G., Olave, E.J., Silvestrin, L., Wheadon, R.. - In: LNL- ANNUAL REPORT. - ISSN 1828-8561. - ELETTRONICO. - LNL Annual Report 2015:INFN‑LNL Report 242(2015), pp. 115-116. | 1-gen-2015 | GIOVINAZZO, CECILIAOLAVE, ELIAS JONHATAN + | - |