Sfoglia per Autore
A CMOS Opamp Immune to EMIwith no Penalty in Baseband Operation
2009 Crovetti, Paolo Stefano; Fiori, Franco
Investigation on the Susceptibility of Integrated Current Sensors to EMI
2009 Aiello, Orazio; Fiori, Franco
An Effective Way of Testing the Susceptibility to EMI of Custom ICs
2009 Amighini, M; Merlo, M; Pezzoli, A; Calcagno, F; Rivizzigno, A; Fiori, Franco
Behavioural Model of Integrated Circuits for EMC Prediction
2009 Fiori, Franco
A New Grounding Scheme to Reduce the Electromagnetic Emission of Smart Power SoCs
2009 Merlin, M.; Fiori, Franco
Introduction to CMOS Analog Circuits
2009 Fiori, Franco
Impact of Package Parasitics on the EMC Performance of SmartPower SoCs
2009 Merlin, M; Fiori, Franco
EMI-inducted failures in MOS power transistors
2009 Bona, Calogero; Fiori, Franco
A new Single-ended I/O with Reduced Electromagnetic Emissions
2009 Fiori, Franco
Influence of the IEC 61967 Test Board on IC Electromagnetic Emissions
2009 VILLAVICENCIO AREVALO, YAMARITA DEL CARMEN; Musolino, Francesco; Fiori, Franco; D., Pandini
Electrical Model of a Microcontroller for EMC Analysis
2009 VILLAVICENCIO AREVALO, YAMARITA DEL CARMEN; Musolino, Francesco; Fiori, Franco
A New Current Sensor Based on MagFET Highly Immune to EMI
2009 Aiello, Orazio; Fiori, Franco
Reducing the Electromagnetic Emissions of Smart Power SoCs by Design
2009 Fiori, Franco
EMI-Induced Failures in sigma-delta converters
2009 Musumeci, D; Fiori, Franco
Conversion of Common Mode into Differential Mode Interference in Bulk Current Injection Tests
2010 Crovetti, Paolo Stefano; Fiori, Franco
A New Integrated Current Sensor Immune to RFI
2010 Aiello, Orazio; Fiori, Franco
Investigations on the susceptibility of ICs to power-switching transients
2010 Musolino, Francesco; Fiori, Franco
A Simulation-based black-box microcontroller model for EME Prediction
2010 VILLAVICENCIO AREVALO, YAMARITA DEL CARMEN; Musolino, Francesco; Fiori, Franco
A New Filtering Technique for Increasing the Immunity of Power Transistors to RFI
2010 Bona, Calogero; Fiori, Franco
A critical assessment of the closed-loop bulk current injection immunity test performed in compliance with ISO 11452-4
2010 Crovetti, Paolo Stefano; Fiori, Franco
Citazione | Data di pubblicazione | Autori | File |
---|---|---|---|
A CMOS Opamp Immune to EMIwith no Penalty in Baseband Operation / Crovetti, Paolo Stefano; Fiori, Franco. - (2009), pp. 533-536. (Intervento presentato al convegno International Symposium on EMC tenutosi a Kyoto nel luglio 2009). | 1-gen-2009 | CROVETTI, Paolo StefanoFIORI, Franco | - |
Investigation on the Susceptibility of Integrated Current Sensors to EMI / Aiello, Orazio; Fiori, Franco. - STAMPA. - (2009), pp. 33-37. (Intervento presentato al convegno EMC Compo 09 tenutosi a Toulouse nel nov. 2009). | 1-gen-2009 | AIELLO, ORAZIOFIORI, Franco | lv_EMC_compo09_05102009 _3_.pdf |
An Effective Way of Testing the Susceptibility to EMI of Custom ICs / Amighini, M; Merlo, M; Pezzoli, A; Calcagno, F; Rivizzigno, A; Fiori, Franco. - (2009), pp. 64-69. (Intervento presentato al convegno EMC Compo 2009 tenutosi a Toulouse nel Nov. 2009). | 1-gen-2009 | FIORI, Franco + | An Effective Way of Testing the Susceptibility to EMI of Custom ICs.pdf |
Behavioural Model of Integrated Circuits for EMC Prediction / Fiori, Franco. - STAMPA. - (2009), pp. 525-528. (Intervento presentato al convegno Internation Symposium on EMC tenutosi a kyoto nel luglio 2009). | 1-gen-2009 | FIORI, Franco | 23Q1-2.pdf |
A New Grounding Scheme to Reduce the Electromagnetic Emission of Smart Power SoCs / Merlin, M.; Fiori, Franco. - STAMPA. - (2009), pp. 66-70. (Intervento presentato al convegno EMC Compo 2009 tenutosi a Toulouse nel nov. 2009). | 1-gen-2009 | FIORI, Franco + | emccompo52_ff_2.pdf |
Introduction to CMOS Analog Circuits / Fiori, Franco. - (2009). | 1-gen-2009 | FIORI, Franco | - |
Impact of Package Parasitics on the EMC Performance of SmartPower SoCs / Merlin, M; Fiori, Franco. - 1:(2009), pp. 1-6. (Intervento presentato al convegno EMPC 2009 tenutosi a Rimini nel june 15-18, 2009). | 1-gen-2009 | FIORI, Franco + | - |
EMI-inducted failures in MOS power transistors / Bona, Calogero; Fiori, Franco. - (2009), pp. 564-567. (Intervento presentato al convegno International Conference on Electromagnetics in Advanced Applications tenutosi a Torino nel 14-18 Sept. 2009). | 1-gen-2009 | BONA, CALOGEROFIORI, Franco | 05297367.pdf |
A new Single-ended I/O with Reduced Electromagnetic Emissions / Fiori, Franco. - In: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. - ISSN 0018-9375. - STAMPA. - 51:(2009), pp. 139-146. [10.1109/TEMC.2008.2008312] | 1-gen-2009 | FIORI, Franco | - |
Influence of the IEC 61967 Test Board on IC Electromagnetic Emissions / VILLAVICENCIO AREVALO, YAMARITA DEL CARMEN; Musolino, Francesco; Fiori, Franco; D., Pandini. - 20th:(2009), pp. 281-284. (Intervento presentato al convegno EMC Zurich 2009 tenutosi a Zurich, Switzerland nel January 12 - January 16, 2009) [10.1109/EMCZUR.2009.4783445]. | 1-gen-2009 | VILLAVICENCIO AREVALO, YAMARITA DEL CARMENMUSOLINO, FRANCESCOFIORI, Franco + | Musolino-Influence.pdf |
Electrical Model of a Microcontroller for EMC Analysis / VILLAVICENCIO AREVALO, YAMARITA DEL CARMEN; Musolino, Francesco; Fiori, Franco. - (2009), pp. 71-74. (Intervento presentato al convegno EMC Compo 2009 tenutosi a Toulouse nel Nov. 2009). | 1-gen-2009 | VILLAVICENCIO AREVALO, YAMARITA DEL CARMENMUSOLINO, FRANCESCOFIORI, Franco | YVFMFF_r.pdf |
A New Current Sensor Based on MagFET Highly Immune to EMI / Aiello, Orazio; Fiori, Franco. - STAMPA. - (2009), pp. 784-787. (Intervento presentato al convegno International Conference on Electromagnetics in Advanced Applications tenutosi a Torino nel sept 2009) [10.1109/ICEAA.2009.5297310]. | 1-gen-2009 | AIELLO, ORAZIOFIORI, Franco | - |
Reducing the Electromagnetic Emissions of Smart Power SoCs by Design / Fiori, Franco. - (2009). (Intervento presentato al convegno 20th International Zurich Symposium on Electromagnetic Compatibility tenutosi a Zurich nel 12-16 January, 2009) [10.1109/EMCZUR.2009.4783486]. | 1-gen-2009 | FIORI, Franco | - |
EMI-Induced Failures in sigma-delta converters / Musumeci, D; Fiori, Franco. - STAMPA. - (2009), pp. 365-368. (Intervento presentato al convegno 20th International Zurich Symposium on Electromagnetic Compatibility tenutosi a Zurich nel 12-16 January, 2009) [10.1109/EMCZUR.2009.4783466]. | 1-gen-2009 | FIORI, Franco + | - |
Conversion of Common Mode into Differential Mode Interference in Bulk Current Injection Tests / Crovetti, Paolo Stefano; Fiori, Franco. - 1:(2010), pp. 15-15. (Intervento presentato al convegno XLII Riunione Annuale del Gruppo di Elettronica (GE2010) tenutosi a Monte Porzio Catone (Roma) nel 7-11 giugno 2010). | 1-gen-2010 | CROVETTI, Paolo StefanoFIORI, Franco | - |
A New Integrated Current Sensor Immune to RFI / Aiello, Orazio; Fiori, Franco. - STAMPA. - (2010), pp. 130-134. (Intervento presentato al convegno IEEJ international analog VLSI workshop tenutosi a pavia nel Sept. 8-10, 2010). | 1-gen-2010 | AIELLO, ORAZIOFIORI, Franco | - |
Investigations on the susceptibility of ICs to power-switching transients / Musolino, Francesco; Fiori, Franco. - In: IEEE TRANSACTIONS ON POWER ELECTRONICS. - ISSN 0885-8993. - STAMPA. - 25:1(2010), pp. 142-151. [10.1109/TPEL.2009.2025132] | 1-gen-2010 | MUSOLINO, FRANCESCOFIORI, Franco | - |
A Simulation-based black-box microcontroller model for EME Prediction / VILLAVICENCIO AREVALO, YAMARITA DEL CARMEN; Musolino, Francesco; Fiori, Franco. - In: IEICE TRANSACTIONS ON COMMUNICATIONS. - ISSN 0916-8516. - E93.B:7(2010), pp. 1715-1722. [10.1587/transcom.E93.B.1715] | 1-gen-2010 | VILLAVICENCIO AREVALO, YAMARITA DEL CARMENMUSOLINO, FRANCESCOFIORI, Franco | - |
A New Filtering Technique for Increasing the Immunity of Power Transistors to RFI / Bona, Calogero; Fiori, Franco. - ELETTRONICO. - (2010), pp. 1090-1093. (Intervento presentato al convegno 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility tenutosi a Beijing nel 12 - 16 Aprile 2010). | 1-gen-2010 | BONA, CALOGEROFIORI, Franco | 462.pdf |
A critical assessment of the closed-loop bulk current injection immunity test performed in compliance with ISO 11452-4 / Crovetti, Paolo Stefano; Fiori, Franco. - STAMPA. - (2010), pp. 177-182. (Intervento presentato al convegno IEEE international symposium on electromagnetic compatibility 2010 tenutosi a Fort Lauderdale (USA) nel 25-30 luglio 2010) [10.1109/ISEMC.2010.5711267]. | 1-gen-2010 | CROVETTI, Paolo StefanoFIORI, Franco | - |
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