This work proposes a set of time and memory bounded Software-Based methodologies for power-on Self test (or key-on self test) of timer modules for safety critical domains, such as automotive and aerospace. Fault simulations campaigns are conducted on an industrial device and intersected with Logic BIST at key-on fault coverages for Stuck-At and Transition Delay fault models. In order to show the portability of the proposed methodology to a smaller technology node, experimental results are presented on Stuck-At and Transition Delay fault models for an open source System-on-Chip.
A Software-Based methodology for In-Field Power-on Self-Test of Safety-Critical Timer Modules / Di Gruttola Giardino, N., Angione, F., Corpino, S., Filipponi, G., Stesina, F., Bertani, C., Tancorre, V., Bernardi, P.. - ELETTRONICO. - (In corso di stampa). (IEEE International Test Conference 2026 San Antonio, TX (USA) October 11–16, 2026).
A Software-Based methodology for In-Field Power-on Self-Test of Safety-Critical Timer Modules
Nicola di Gruttola Giardino;Francesco Angione;Sabrina Corpino;Gabriele Filipponi;Fabrizio Stesina;Paolo Bernardi
In corso di stampa
Abstract
This work proposes a set of time and memory bounded Software-Based methodologies for power-on Self test (or key-on self test) of timer modules for safety critical domains, such as automotive and aerospace. Fault simulations campaigns are conducted on an industrial device and intersected with Logic BIST at key-on fault coverages for Stuck-At and Transition Delay fault models. In order to show the portability of the proposed methodology to a smaller technology node, experimental results are presented on Stuck-At and Transition Delay fault models for an open source System-on-Chip.| File | Dimensione | Formato | |
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ITC26_Timers.pdf
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https://hdl.handle.net/11583/3016813
