New memory production modern technologies introduce new classes of faults usually referred to as dynamic memory faults. Although some hand-made March tests to deal with these new faults have been published, the problem of automatically generate March tests for dynamic faults has still to be addressed, in this paper we propose a new approach to automatically generate March tests with minimal length for both static and dynamic faults. The proposed approach resorts to a formal model to represent faulty behaviors in a memory and to simplify the generation of the corresponding tests.

Automatic March tests generation for static and dynamic faults in SRAMs / Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto. - STAMPA. - (2005), pp. 122-127. ((Intervento presentato al convegno IEEE 10th European Test Symposium (ETS) tenutosi a Tallin, EE nel 22-25 May 2005 [10.1109/ETS.2005.8].

Automatic March tests generation for static and dynamic faults in SRAMs

BENSO, Alfredo;BOSIO, ALBERTO;DI CARLO, STEFANO;DI NATALE, Giorgio;PRINETTO, Paolo Ernesto
2005

Abstract

New memory production modern technologies introduce new classes of faults usually referred to as dynamic memory faults. Although some hand-made March tests to deal with these new faults have been published, the problem of automatically generate March tests for dynamic faults has still to be addressed, in this paper we propose a new approach to automatically generate March tests with minimal length for both static and dynamic faults. The proposed approach resorts to a formal model to represent faulty behaviors in a memory and to simplify the generation of the corresponding tests.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11583/1416292
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