IARIA, GIUSY
 Distribuzione geografica
Continente #
EU - Europa 277
NA - Nord America 151
AS - Asia 75
SA - Sud America 3
AF - Africa 1
Totale 507
Nazione #
IT - Italia 185
US - Stati Uniti d'America 151
CN - Cina 27
SG - Singapore 24
FR - Francia 17
BE - Belgio 15
IE - Irlanda 13
DE - Germania 12
NL - Olanda 9
RU - Federazione Russa 7
GB - Regno Unito 6
FI - Finlandia 5
CH - Svizzera 4
IN - India 4
JO - Giordania 4
KR - Corea 4
TR - Turchia 4
AT - Austria 2
HK - Hong Kong 2
ID - Indonesia 2
JP - Giappone 2
PE - Perù 2
CO - Colombia 1
DK - Danimarca 1
LT - Lituania 1
SN - Senegal 1
TH - Thailandia 1
TW - Taiwan 1
Totale 507
Città #
Turin 79
Council Bluffs 26
Singapore 21
Boardman 17
Santa Clara 15
Brussels 14
Chandler 13
Dublin 13
Beijing 12
Milan 11
Ashburn 10
Perugia 10
Palermo 9
Collegno 8
Helsinki 5
Houston 5
Torino 5
Bern 4
Istanbul 4
Piscataway 4
Plano 4
Vercelli 4
Cadoneghe 3
Princeton 3
Southend 3
Washington 3
Ancona 2
Aosta 2
Berlin 2
Gorgonzola 2
Jakarta 2
Messina 2
Munich 2
Nave 2
New Delhi 2
Puente Piedra 2
Rome 2
San Diego 2
San Francisco 2
Seattle 2
Trofarello 2
Villa Literno 2
Ōita 2
Agropoli 1
Amsterdam 1
Bad Muenstereifel 1
Bangkok 1
Boydton 1
Chennai 1
Clifton 1
Edinburgh 1
Fasano 1
Frankfurt am Main 1
Fuzhou 1
Genova 1
Grugliasco 1
Guiyang 1
Hemiksem 1
Hsinchu 1
Kolkata 1
Maarssen 1
Miami 1
Minneapolis 1
Mongrando 1
Naples 1
Nijmegen 1
Penne 1
Rimini 1
Seoul 1
Shanghai 1
Shenyang 1
St Petersburg 1
Stuttgart 1
Taastrup 1
Tunja 1
Vienna 1
Villastellone 1
Yubileyny 1
Zhuhai 1
Écully 1
Totale 376
Nome #
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip 141
A novel SEU injection setup for Automotive SoC 141
In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip 83
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip 78
About the correlation between logical identified faulty gates and their layout characteristics 58
Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips 23
A Comprehensive Scan Test Cost Model to Optimize the Production of very large SoCs 5
Totale 529
Categoria #
all - tutte 2.024
article - articoli 72
book - libri 0
conference - conferenze 1.952
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 4.048


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/202248 0 0 0 0 0 0 0 0 0 0 39 9
2022/2023186 2 7 35 7 17 21 24 6 25 5 21 16
2023/2024146 16 22 17 6 13 22 16 7 6 5 9 7
2024/2025149 3 27 10 47 25 37 0 0 0 0 0 0
Totale 529