Archivio Istituzionale della RicercaBUGHIO, AHSIN MURTAZA
BUGHIO, AHSIN MURTAZA
Dipartimento di Elettronica e Telecomunicazioni
037086
Variability analysis of FinFET AC/RF performances through efficient physics-based simulations for the optimization of RF CMOS stages
2018 Bughio, AHSIN MURTAZA
Variability of FinFET AC parameters: A physics-based insight
2018 Bughio, AHSIN MURTAZA; DONATI GUERRIERI, Simona; Bonani, Fabrizio; Ghione, Giovanni
Multi-gate FinFET Mixer Variability assessment through physics-based simulation
2017 Bughio, AHSIN MURTAZA; DONATI GUERRIERI, Simona; Bonani, Fabrizio; Ghione, Giovanni
Physics-based modeling of FinFET RF variability under Shorted- and Independent-Gates bias
2017 Bughio, AHSIN MURTAZA; DONATI GUERRIERI, Simona; Bonani, Fabrizio; Ghione, Giovanni
RF sensitivity analysis of independent-gates FinFETs for analog applications exploiting the back-gating effect
2017 Bughio, A. M.; Guerrieri, S. Donati; Bonani, F.; Ghione, G.
Physics-based analysis of FinFET RF variability including parasitics
2016 Bughio, AHSIN MURTAZA; DONATI GUERRIERI, Simona; Bonani, Fabrizio; Ghione, Giovanni
Physics-based modeling of FinFET RF variability
2016 Bughio, AHSIN MURTAZA; DONATI GUERRIERI, Simona; Bonani, Fabrizio; Ghione, Giovanni
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Variability analysis of FinFET AC/RF performances through efficient physics-based simulations for the optimization of RF CMOS stages / Bughio, A.M.. - (2018 Jun 05). [10.6092/polito/porto/2709421] | 5-giu-2018 | BUGHIO, AHSIN MURTAZA | Thesis-Variability analysis of FinFET.pdf |
| Variability of FinFET AC parameters: A physics-based insight / Bughio, A.M., DONATI GUERRIERI, S., Bonani, F., Ghione, G.. - In: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. - ISSN 0894-3370. - ELETTRONICO. - 31:3(2018), p. e2285. [10.1002/jnm.2285] | 1-gen-2018 | BUGHIO, AHSIN MURTAZADONATI GUERRIERI, SimonaBONANI, FABRIZIOGHIONE, GIOVANNI | - |
| Multi-gate FinFET Mixer Variability assessment through physics-based simulation / Bughio, A.M., DONATI GUERRIERI, S., Bonani, F., Ghione, G.. - In: IEEE ELECTRON DEVICE LETTERS. - ISSN 0741-3106. - STAMPA. - 38:8(2017), pp. 1004-1007. [10.1109/LED.2017.2717460] | 1-gen-2017 | BUGHIO, AHSIN MURTAZADONATI GUERRIERI, SimonaBONANI, FABRIZIOGHIONE, GIOVANNI | 07953636.pdf; EDL 17.pdf |
| Physics-based modeling of FinFET RF variability under Shorted- and Independent-Gates bias / Bughio, A.M., DONATI GUERRIERI, S., Bonani, F., Ghione, G.. - ELETTRONICO. - (2017), pp. 1-4. (Integrated Nonlinear Microwave and Millimetre-wave Circuits Workshop (INMMiC) Graz, Austria 20-21 April 2017) [10.1109/INMMIC.2017.7927300]. | 1-gen-2017 | BUGHIO, AHSIN MURTAZADONATI GUERRIERI, SimonaBONANI, FABRIZIOGHIONE, GIOVANNI | - |
| RF sensitivity analysis of independent-gates FinFETs for analog applications exploiting the back-gating effect / Bughio, A.M., Guerrieri, S.D., Bonani, F., Ghione, G.. - STAMPA. - (2017), pp. 256-259. (European Microwave Integrated Circuits Conference Nuremburg, Germany 9-10 October, 2017) [10.23919/EuMIC.2017.8230708]. | 1-gen-2017 | Bughio, A. M.Guerrieri, S. DonatiBonani, F.Ghione, G. | - |
| Physics-based analysis of FinFET RF variability including parasitics / Bughio, A.M., DONATI GUERRIERI, S., Bonani, F., Ghione, G.. - ELETTRONICO. - (2016), pp. 1-1. (48th Annual Meeting of the Associazione Gruppo Italiano di Elettronica (GE) Brescia, Italy June 22 to 24, 2016). | 1-gen-2016 | BUGHIO, AHSIN MURTAZADONATI GUERRIERI, SimonaBONANI, FABRIZIOGHIONE, GIOVANNI | - |
| Physics-based modeling of FinFET RF variability / Bughio, A.M., DONATI GUERRIERI, S., Bonani, F., Ghione, G.. - (2016). (European Microwave Integrated Circuits Conference (EUMIC) London, UK 3-7 October 2016). | 1-gen-2016 | BUGHIO, AHSIN MURTAZADONATI GUERRIERI, SimonaBONANI, FABRIZIOGHIONE, GIOVANNI | Final manuscript.pdf |