Archivio Istituzionale della RicercaWANG, CHANGHAO
WANG, CHANGHAO
Dipartimento di Automatica e Informatica
112165
From Synthesis to Kinetics: A Data-Driven Deep Learning Framework for Process-Aware Ferroelectric Dynamics
In corso di stampa Wang, Changhao; Yao, Xinhao; Chen, Danyang; Li, Chaobo; Li, Xiuyan; Yuan, Sicong; Xun, Hanzhi; Hamdioui, Said; Bellarmino, Nicolo'; Cantoro, Riccardo
Si-ATLAS: Autonomous Testing via LLM-Agent Synergy for RISC-V SBST Generation
In corso di stampa Wang, Changhao; Chen, Yijing; Bellarmino, Nicolo'; Rodriguez Condia, Josie Esteban; Li, Chaobo; Squillero, Giovanni; Cantoro, Riccardo
Device-Aware Test for Anomalous Charge Trapping in FeFETs
2025 Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said
Device-Aware Test for Threshold Voltage Shifting in FeFET
2025 Wang, Changhao; Kolahimahmoudi, Nima; Bellarmino, Nicolo; Cantoro, Riccardo; Yuan, Sicong; Xun, Hanzhi; Chen, Danyang; Yin, Chujun; Taouil, Mottaqiallah; Fieback, Moritz; Li, Xiuyan; Wang, Lin; Li, Chaobo; Hamdioui, Said
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| From Synthesis to Kinetics: A Data-Driven Deep Learning Framework for Process-Aware Ferroelectric Dynamics / Wang, C., Yao, X., Chen, D., Li, C., Li, X., Yuan, S., Xun, H., Hamdioui, S., Bellarmino, N., Cantoro, R.. - (In corso di stampa). (The Fourteenth International Conference on Learning Representations (ICLR 2026) Rio de Janeiro, Brazil April 23rd - 27th, 2026). | In corso di stampa | Changhao, WangSaid, HamdiouiNicolò, BellarminoRiccardo, Cantoro + | 7_From_Synthesis_to_Kinetics_A.pdf |
| Si-ATLAS: Autonomous Testing via LLM-Agent Synergy for RISC-V SBST Generation / Wang, C., Chen, Y., Bellarmino, N., Rodriguez Condia, J.E., Li, C., Squillero, G., Cantoro, R.. - (In corso di stampa). (International Test Conference 2026 (ITC 2026) San Antonio, Texas, USA October 11–16, 2026). | In corso di stampa | Changhao, WangNicolo, BellarminoJosie Esteban, Rodriguez CondiaGiovanni, SquilleroRiccardo, Cantoro + | 2026_ITC_SBST_agent (1).pdf |
| Device-Aware Test for Anomalous Charge Trapping in FeFETs / Yuan, S., Wang, C., Fieback, M., Xun, H., Taouil, M., Li, X., Wang, L., Chen, D., Bellarmino, N., Cantoro, R., Hamdioui, S.. - (2025), pp. 635-641. (30th Asia and South Pacific Design Automation Conference ASP-DAC 2025 Tokyo (JPN) Jan. 20-23, 2025) [10.1145/3658617.3697755]. | 1-gen-2025 | Changhao WangNicolò BellarminoRiccardo CantoroSaid Hamdioui + | 3658617.3697755.pdf |
| Device-Aware Test for Threshold Voltage Shifting in FeFET / Wang, C., Kolahimahmoudi, N., Bellarmino, N., Cantoro, R., Yuan, S., Xun, H., Chen, D., Yin, C., Taouil, M., Fieback, M., Li, X., Wang, L., Li, C., Hamdioui, S.. - (2025), pp. 410-413. (IEEE International Test Conference 2025 San Diego (USA) 20-26 September 2025) [10.1109/ITC58126.2025.00052]. | 1-gen-2025 | Wang, ChanghaoKolahimahmoudi, NimaBellarmino, NicoloCantoro, RiccardoHamdioui, Said + | 2025_ITC__Device_Aware_Test_for_voltage_shifting_in_FeFET__4_pages_.pdf; Device-Aware_Test_for_Threshold_Voltage_Shifting_in_FeFET.pdf |