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Hardening Dynamically Reconfigurable Processing Modules Architectures: A Neutron Test Experience
In corso di stampa Desogus, Marco; Sterpone, Luca; Sabena, Davide; Ullah, Anees; Mario, Porrmann; Jens, Hagemeyer; Jorgan, Ilstad
Analysis and mitigation of SEUs in ARM-based SoC on Xilinx Virtex-V SRAM-based FPGAS
2015 Du, Boyang; Desogus, Marco; Sterpone, Luca
Using Benchmarks for Radiation Testing of Microprocessors and FPGAs
2015 Quinn, Heather; Robinson, William H.; Rech, Paolo; Aguirre, Miguel; Barnard, Arno; Desogus, Marco; Entrena, Luis; Garcia Valderas, Mario; Guertin, Steven M.; Kaeli, David; Kastensmidt, Fernanda Lima; Kiddie, Bradley T.; Sanchez Clemente, Antonio; SONZA REORDA, Matteo; Sterpone, Luca; Wirthlin, Michael
Validation of a tool for estimating the effects of Soft- Errors on modern SRAM-based FPGAs
2014 Desogus, Marco; Sterpone, Luca; David Merodio, Codinachs
Validation and robustness assessment of an automotive system
2013 Desogus, Marco; SONZA REORDA, Matteo; Sterpone, Luca; Avantaggiati, V. A.; Audisio, G.; Sabatini, M.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Hardening Dynamically Reconfigurable Processing Modules Architectures: A Neutron Test Experience / Desogus, Marco; Sterpone, Luca; Sabena, Davide; Ullah, Anees; Mario, Porrmann; Jens, Hagemeyer; Jorgan, Ilstad. - (In corso di stampa). (Intervento presentato al convegno Radiation Effects on Components and Systems 2013). | In corso di stampa | DESOGUS, MARCOSTERPONE, LucaSABENA, DAVIDEULLAH, ANEES + | - |
| Analysis and mitigation of SEUs in ARM-based SoC on Xilinx Virtex-V SRAM-based FPGAS / Du, Boyang; Desogus, Marco; Sterpone, Luca. - (2015), pp. 236-239. (Intervento presentato al convegno 11th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2015 tenutosi a gbr nel 2015) [10.1109/PRIME.2015.7251378]. | 1-gen-2015 | DU, BOYANGDESOGUS, MARCOSTERPONE, LUCA | - |
| Using Benchmarks for Radiation Testing of Microprocessors and FPGAs / Quinn, Heather; Robinson, William H.; Rech, Paolo; Aguirre, Miguel; Barnard, Arno; Desogus, Marco; Entrena, Luis; Garcia Valderas, Mario; Guertin, Steven M.; Kaeli, David; Kastensmidt, Fernanda Lima; Kiddie, Bradley T.; Sanchez Clemente, Antonio; SONZA REORDA, Matteo; Sterpone, Luca; Wirthlin, Michael. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - ELETTRONICO. - 62:6(2015), pp. 2547-2554. [10.1109/TNS.2015.2498313] | 1-gen-2015 | RECH, PAOLODESOGUS, MARCOSONZA REORDA, MatteoSTERPONE, LUCA + | 07348783.pdf |
| Validation of a tool for estimating the effects of Soft- Errors on modern SRAM-based FPGAs / Desogus, Marco; Sterpone, Luca; David Merodio, Codinachs. - ELETTRONICO. - (2014), pp. 111-115. (Intervento presentato al convegno IEEE 20th International On-Line Testing Symposium tenutosi a Platja d’Aro, Catalunya, Spain nel 7 - 9 July 2014). | 1-gen-2014 | DESOGUS, MARCOSTERPONE, Luca + | - |
| Validation and robustness assessment of an automotive system / Desogus, Marco; SONZA REORDA, Matteo; Sterpone, Luca; Avantaggiati, V. A.; Audisio, G.; Sabatini, M.. - ELETTRONICO. - (2013). (Intervento presentato al convegno 8th IEEE International Design & Test Symposium (IDT) tenutosi a Marrakech nel 16-18 Dicembre 2013). | 1-gen-2013 | DESOGUS, MARCOSONZA REORDA, MatteoSTERPONE, Luca + | - |