GARAU, Francesco
GARAU, Francesco
Dipartimento di Meccanica (attivo dal 01/01/1900 al 03/01/2014)
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Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries
2022 Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries
2022 Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, Virendra; Reorda, Matteo Sonza
Citazione | Data di pubblicazione | Autori | File |
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Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries / Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud. - (2022), pp. 1-2. (Intervento presentato al convegno 2022 IEEE European Test Symposium tenutosi a Barcelona (SP) nel 23-27 Maggio 2022) [10.1109/ETS54262.2022.9810392]. | 1-gen-2022 | Cantoro, RiccardoGarau, FrancescoKolahimahmoudi, NimaSartoni, SandroReorda, Matteo Sonza + | ETS22___Effective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self_Test_Libraries.pdf; Effective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self-Test_Libraries.pdf |
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries / Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, Virendra; Reorda, Matteo Sonza. - (2022), pp. 1-7. (Intervento presentato al convegno 2022 IEEE 40th VLSI Test Symposium (VTS) tenutosi a San Diego (USA) nel 25-27 Aprile 2022) [10.1109/VTS52500.2021.9794219]. | 1-gen-2022 | Cantoro, RiccardoGarau, FrancescoMasante, RiccardoSartoni, SandroReorda, Matteo Sonza + | VTS22___Exploiting_post_silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries__CAMERA_READY_.pdf; Exploiting_post-silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries.pdf |