Late Breaking Results - New Techniques for Software Test Library Compaction

Software Test Libraries (STLs) are systematically used in safety-critical applications to detect permanent faults. STLs are often run during the application idle times: hence, their duration should be minimal. STL generation is complex, due to limited support by EDA tools, and they often come from a mix of manual, random, and ATPG-based approaches. This paper introduces some new techniques aiming at improving the STL compaction process, so that its execution time is minimized, while the achieved compaction is better, and the Stuck-at Fault Coverage it provides remains basically unchanged (or increases).