Characterization of the Frequency Dependence of Impedance standards with a Dual Josephson Impedance Bridge

In this work, the frequency dependence of impedance standards is characterized using a quantum-based impedance bridge. The 1 : 1 ratio of two quadrifilar calculable resistance standards and the impedance of a 1 nF capacitance standard are measured from 180Hz to 80 kHz. At 1233Hz the combined standard uncertainty is 30 nF/F for the relative capacitance and 2.5 nohm/ohm for the resistance ratio, demonstrating the unique capability of the bridge for accurate impedance standards characterization.