This paper introduces TestIt, an open-source Python package designed to automate full-system integration testing using a Software-Based Self-Test (SBST) approach. By dynamically generating test vectors and golden references, TestIt significantly reduces development time and complexity while supporting both simulation and FPGA environments. Its flexible design positions TestIt as a key enabler for the widespread adoption of CI/CD methodologies in open-source RTL development. A case study on the X-HEEP RISC-V microcontroller (MCU), which integrates a custom accelerator, showcases TestIt’s ability to detect hardware and software faults that traditional formal methods may overlook. Furthermore, the case study highlights how TestIt can be leveraged to characterize system performance with minimal effort. By automating testing on the PYNQ-Z2 FPGA development board, we achieved a 11× speed-up with respect to RTL simulations.

Just TestIt! An SBST Approach To Automate System-Integration Testing / Terzano, Tommaso; Giuffrida, Luigi; Sapriza, Juan; Schiavone, Pasquale Davide; Masera, Guido; Atienza, David; Lavagno, Luciano; Martina, Maurizio. - (2025), pp. 74-77. (Intervento presentato al convegno 22nd ACM International Conference on Computing Frontiers tenutosi a Cagliari (Ita) nel May 28–30, 2025) [10.1145/3706594.3726980].

Just TestIt! An SBST Approach To Automate System-Integration Testing

Terzano, Tommaso;Giuffrida, Luigi;Masera, Guido;Atienza, David;Lavagno, Luciano;Martina, Maurizio
2025

Abstract

This paper introduces TestIt, an open-source Python package designed to automate full-system integration testing using a Software-Based Self-Test (SBST) approach. By dynamically generating test vectors and golden references, TestIt significantly reduces development time and complexity while supporting both simulation and FPGA environments. Its flexible design positions TestIt as a key enabler for the widespread adoption of CI/CD methodologies in open-source RTL development. A case study on the X-HEEP RISC-V microcontroller (MCU), which integrates a custom accelerator, showcases TestIt’s ability to detect hardware and software faults that traditional formal methods may overlook. Furthermore, the case study highlights how TestIt can be leveraged to characterize system performance with minimal effort. By automating testing on the PYNQ-Z2 FPGA development board, we achieved a 11× speed-up with respect to RTL simulations.
2025
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/3001609