Archivio Istituzionale della RicercaThis summary paper presents the results for establishing traceable mutual inductance measurements at low frequencies. The measurements performed were validated by comparing the results with an established fully-digital impedance bridge. The use of mutual inductors for the simulation of high capacitance values and its potential use for calibration of electrochemical impedance spectroscopy meters is discussed.
Traceable measurements of mutual inductance standards applied to large capacitance simulation in electrochemical impedance spectroscopy / Medved, Juan; Cultrera, Alessandro; Marzano, Martina; D'Elia, Vincenzo; Ortolano, Massimo; Callegaro, Luca. - ELETTRONICO. - (2024), pp. 1-2. (Intervento presentato al convegno Conference on Precision Electromagnetic Measurements (CPEM) tenutosi a Denver, CO (USA) nel 08-12 July 2024) [10.1109/cpem61406.2024.10646077].
Traceable measurements of mutual inductance standards applied to large capacitance simulation in electrochemical impedance spectroscopy
Medved, Juan;Ortolano, Massimo;
2024
Abstract
This summary paper presents the results for establishing traceable mutual inductance measurements at low frequencies. The measurements performed were validated by comparing the results with an established fully-digital impedance bridge. The use of mutual inductors for the simulation of high capacitance values and its potential use for calibration of electrochemical impedance spectroscopy meters is discussed.
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Medved2024_CPEM_postprint.pdf
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Ortolano-Traceable.pdf
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https://hdl.handle.net/11583/2992336