Leakage discharge currents represent one of the most detrimental factors for the maximum hold time in analog sample-and-hold circuits. Apart from the obvious passive solution of enlarging the sampling capacitor, alternatives based on active circuits have been proposed. We focus here on an existing solution which has proven to be effective in reducing the leakage discharge, hence extending the hold time, by a factor of 20. Being based on a feedback circuit built around the hold capacitor, it is paramount to understand its stability properties. This work tries to close the gap by analyzing the closed-loop stability of the nominal circuit. Classical control systems techniques are employed to thoroughly analyze the dynamic behaviour of the feedback circuit, highlighting the detrimental effect of device mismatches.
Stability and mismatch robustness of a leakage current cancellation technique / Paolino, C.; Pareschi, F.; Rovatti, R.; Setti, G.. - STAMPA. - 2021:(2021). (Intervento presentato al convegno 53rd IEEE International Symposium on Circuits and Systems, ISCAS 2021 tenutosi a Daegu, Corea del Sud [virtual] nel May 22-28, 2021) [10.1109/ISCAS51556.2021.9401430].
Stability and mismatch robustness of a leakage current cancellation technique
Paolino C.;Pareschi F.;Setti G.
2021
Abstract
Leakage discharge currents represent one of the most detrimental factors for the maximum hold time in analog sample-and-hold circuits. Apart from the obvious passive solution of enlarging the sampling capacitor, alternatives based on active circuits have been proposed. We focus here on an existing solution which has proven to be effective in reducing the leakage discharge, hence extending the hold time, by a factor of 20. Being based on a feedback circuit built around the hold capacitor, it is paramount to understand its stability properties. This work tries to close the gap by analyzing the closed-loop stability of the nominal circuit. Classical control systems techniques are employed to thoroughly analyze the dynamic behaviour of the feedback circuit, highlighting the detrimental effect of device mismatches.File | Dimensione | Formato | |
---|---|---|---|
Stability'n'Mismatch.pdf
accesso aperto
Descrizione: Author version of the Paper
Tipologia:
2. Post-print / Author's Accepted Manuscript
Licenza:
PUBBLICO - Tutti i diritti riservati
Dimensione
474.08 kB
Formato
Adobe PDF
|
474.08 kB | Adobe PDF | Visualizza/Apri |
Stability_and_Mismatch_Robustness_of_a_Leakage_Current_Cancellation_Technique.pdf
non disponibili
Descrizione: Editorial Version
Tipologia:
2a Post-print versione editoriale / Version of Record
Licenza:
Non Pubblico - Accesso privato/ristretto
Dimensione
1.26 MB
Formato
Adobe PDF
|
1.26 MB | Adobe PDF | Visualizza/Apri Richiedi una copia |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/2918012