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EnglishThe use of second-level testing to reduce Type II errors in RNG validation was suggested from the very beginning though rarely employed in real-world cases. Yet, as security requirements become more critical and the availability of even faster RNG more commonplace, second-level testing will be key to distinguishing RNGs based on the quality of very large chunks of their output. This paper addresses some principles governing the proper design of second-level tests (i.e. how to divide available data into chunks and how to compute second-level p-values) as well as its implications on the design of the underlying basic tests. © 2007 IEEE.
Second-level testing revisited and applications to NIST SP800-22 / Pareschi, F.; Rovatti, R.; Setti, G.. - STAMPA. - (2007), pp. 627-630. ((Intervento presentato al convegno European Conference on Circuit Theory and Design 2007, ECCTD 2007 tenutosi a Seville, esp nel August 26-30, 2007.
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| Titolo: | Second-level testing revisited and applications to NIST SP800-22 | |
| Autori: | ||
| Data di pubblicazione: | 2007 | |
| Abstract: | The use of second-level testing to reduce Type II errors in RNG validation was suggested from the... very beginning though rarely employed in real-world cases. Yet, as security requirements become more critical and the availability of even faster RNG more commonplace, second-level testing will be key to distinguishing RNGs based on the quality of very large chunks of their output. This paper addresses some principles governing the proper design of second-level tests (i.e. how to divide available data into chunks and how to compute second-level p-values) as well as its implications on the design of the underlying basic tests. © 2007 IEEE. | |
| ISBN: | 978-1-4244-1341-6 | |
| Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
File in questo prodotto:
| File | Descrizione | Tipologia | Licenza | |
|---|---|---|---|---|
| B3L-F2.pdf | Editorial Version | 2a Post-print versione editoriale / Version of Record | Non Pubblico - Accesso privato/ristretto | Administrator Richiedi una copia |
| ECCTD2007-randomtests.pdf | Author version of the Paper | 2. Post-print / Author's Accepted Manuscript | PUBBLICO - Tutti i diritti riservati | Visibile a tuttiVisualizza/Apri |
http://hdl.handle.net/11583/2850185
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