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EnglishNowadays, data-intensive processing applications, such as multimedia, high-performance computing and safety-critical ones (e.g., in automotive) employ General Purpose Graphics Processing Units (GPGPUs) due to their parallel processing capabilities and high performance. In these devices, multiple levels of memories are employed in GPGPUs to hide latency and increase the performance during the operation of a kernel. Moreover, modern GPGPU architectures implement cutting-edge semiconductor technologies, reducing their size and power consumption. However, some studies proved that these technologies are prone to faults during the operative life of a device, so compromising reliability. In this work, we developed functional test techniques based on parallel Software-Based Self-Test routines to test memory structures in the memory hierarchy of a GPGPU (FlexGripPlus) implementing the G80 architecture of Nvidia.
On the testing of special memories in GPGPUs / Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - ELETTRONICO. - (2020), pp. 1-6. ((Intervento presentato al convegno 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Napoli, Italy nel 13-15 July 2020 [10.1109/IOLTS50870.2020.9159711].
| Titolo: | On the testing of special memories in GPGPUs | |
| Autori: | ||
| Data di pubblicazione: | 2020 | |
| Abstract: | Nowadays, data-intensive processing applications, such as multimedia, high-performance computing ...and safety-critical ones (e.g., in automotive) employ General Purpose Graphics Processing Units (GPGPUs) due to their parallel processing capabilities and high performance. In these devices, multiple levels of memories are employed in GPGPUs to hide latency and increase the performance during the operation of a kernel. Moreover, modern GPGPU architectures implement cutting-edge semiconductor technologies, reducing their size and power consumption. However, some studies proved that these technologies are prone to faults during the operative life of a device, so compromising reliability. In this work, we developed functional test techniques based on parallel Software-Based Self-Test routines to test memory structures in the memory hierarchy of a GPGPU (FlexGripPlus) implementing the G80 architecture of Nvidia. | |
| ISBN: | 978-1-7281-8187-5 | |
| Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
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| File | Descrizione | Tipologia | Licenza | |
|---|---|---|---|---|
| camera ready.pdf | post-print version of the manuscript | 2. Post-print / Author's Accepted Manuscript | PUBBLICO - Tutti i diritti riservati | Visibile a tuttiVisualizza/Apri |
| 09159711.pdf | 2a Post-print versione editoriale / Version of Record | Non Pubblico - Accesso privato/ristretto | Administrator Richiedi una copia |
http://hdl.handle.net/11583/2842911
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