Software-based self-test (SBST) is being widely used in both manufacturing and in-the-field testing of processor-based devices and Systems-on-Chips. Unfortunately, the stuck-at fault model is increasingly inadequate to match the new and different types of defects in the most recent semiconductor technologies, while the explicit and separate targeting of every fault model in SBST is cumbersome due to the high complexity of the test-generation process, the lack of automation tools, and the high CPU-intensity of the fault-simulation process. Moreover, defects in advanced semiconductor technologies are not always covered by the most commonly used fault-models, and the probability of defect-escapes increases even more. To overcome these shortcomings we propose the first fault-independent SBST method. The proposed method is almost fully automated, it offers high coverage of non-modeled faults by means of a novel SBST-oriented probabilistic metric, and it is very fast as it omits the time-consuming test-generation/fault-simulation processes. Extensive experiments on the OpenRISC OR1200 processor show the advantages of the proposed method.

Fault-Independent Test-Generation for Software-Based Self-Testing / Georgiou, P.; Kavousianos, X.; Cantoro, R.; Reorda, M. S.. - ELETTRONICO. - (2018), pp. 79-84. ((Intervento presentato al convegno 24th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2018 tenutosi a Platja d'Aro, Spain nel 2-4 July 2018 [10.1109/IOLTS.2018.8474081].

Fault-Independent Test-Generation for Software-Based Self-Testing

Cantoro R.;Reorda M. S.
2018

Abstract

Software-based self-test (SBST) is being widely used in both manufacturing and in-the-field testing of processor-based devices and Systems-on-Chips. Unfortunately, the stuck-at fault model is increasingly inadequate to match the new and different types of defects in the most recent semiconductor technologies, while the explicit and separate targeting of every fault model in SBST is cumbersome due to the high complexity of the test-generation process, the lack of automation tools, and the high CPU-intensity of the fault-simulation process. Moreover, defects in advanced semiconductor technologies are not always covered by the most commonly used fault-models, and the probability of defect-escapes increases even more. To overcome these shortcomings we propose the first fault-independent SBST method. The proposed method is almost fully automated, it offers high coverage of non-modeled faults by means of a novel SBST-oriented probabilistic metric, and it is very fast as it omits the time-consuming test-generation/fault-simulation processes. Extensive experiments on the OpenRISC OR1200 processor show the advantages of the proposed method.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11583/2838575