SRAM-based FPGA devices manufactured in FinFET technologies provide performances and characteristics suitable for avionics and aerospace applications. The estimation of error rate sensitivity to harsh environments is a major concern for enabling their usage on such application fields. In this paper, we propose a new estimation approach able to consider the radiation effects on the configuration memory and logic layer of FPGAs, providing a comprehensive Application Error Rate probability estimation. Experimental results provide a comparison between radiation test campaigns, which demonstrates the feasibility of the proposed solution.
A Novel Error Rate Estimation Approach for UltraScale+ SRAM-based FPGAs / Sterpone, Luca; Azimi, Sarah; Bozzoli, Ludovica; Du, Boyang; Lange, Thomas; Maximilien, Glorieux; Dan, Alexandrescu; Cesar Boatella, Polo; MERODIO CODINACHS, David. - (2018), pp. 120-126. (Intervento presentato al convegno IEEE Adaptive Hardware and Systems (AHS), 2018 NASA/ESA Conference) [10.1109/AHS.2018.8541474].
A Novel Error Rate Estimation Approach for UltraScale+ SRAM-based FPGAs
STERPONE, LUCA;AZIMI, SARAH;BOZZOLI, LUDOVICA;DU, BOYANG;LANGE, THOMAS;MERODIO CODINACHS, DAVID
2018
Abstract
SRAM-based FPGA devices manufactured in FinFET technologies provide performances and characteristics suitable for avionics and aerospace applications. The estimation of error rate sensitivity to harsh environments is a major concern for enabling their usage on such application fields. In this paper, we propose a new estimation approach able to consider the radiation effects on the configuration memory and logic layer of FPGAs, providing a comprehensive Application Error Rate probability estimation. Experimental results provide a comparison between radiation test campaigns, which demonstrates the feasibility of the proposed solution.File | Dimensione | Formato | |
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https://hdl.handle.net/11583/2712639