Thanks to the immunity against Single Event Upsets in configuration memory, Flash-based FPGA is becoming widely adopted in mission- and safety-critical applications, such as in aerospace field. However, the decreasing of device feature size leads to an increasing of the device sensitivity regarding Single Event Transients (SETs). In this paper, we developed a new workflow to evaluate SET phenomena in a specific convergence case and introduce a new mitigation of SET pulse without introducing any performance penalization to the original netlist.

On the Mitigation of Single Event Transients on Flash-based FPGAs / Azimi, Sarah; Du, Boyang; Sterpone, Luca. - ELETTRONICO. - (2018). (Intervento presentato al convegno IEEE European Test Symposium (ETS 2018) tenutosi a Bremen, Germany nel 28 May- 01 June, 2018) [10.1109/ETS.2018.8400715].

On the Mitigation of Single Event Transients on Flash-based FPGAs

Sarah Azimi;Boyang Du;Luca Sterpone
2018

Abstract

Thanks to the immunity against Single Event Upsets in configuration memory, Flash-based FPGA is becoming widely adopted in mission- and safety-critical applications, such as in aerospace field. However, the decreasing of device feature size leads to an increasing of the device sensitivity regarding Single Event Transients (SETs). In this paper, we developed a new workflow to evaluate SET phenomena in a specific convergence case and introduce a new mitigation of SET pulse without introducing any performance penalization to the original netlist.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2710164