It is well-known that internal defects play a key role in the Very-High-Cycle Fatigue (VHCF) response of metallic materials. VHCF failures generally nucleate from internal defects, whose size strongly affects the material strength and life. Therefore, S-N curves in the VHCF regime are defect size dependent and the scatter of fatigue data is significantly influenced by the statistical distribution of the defect size within the material. The present paper proposes an innovative approach for the statistical modeling of Probabilistic-S-N (P-S-N) curves in the VHCF regime. The proposed model considers conditional P-S-N curves that depend on a specific value of the initial defect size. From the statistical distribution of the initial defect size, marginal P-S-N curves are estimated and the effect of the risk-volume on the VHCF response is also modeled. Finally, the paper reports a numerical example that quantitatively illustrates the concepts of conditional and marginal P-S-N curves and that shows the effect of the risk-volume on the VHCF response.

Effect of defect size on P-S-N curves in Very-High-Cycle Fatigue / Paolino, Davide S.; Tridello, Andrea; Chiandussi, Giorgio; Rossetto, Massimo. - In: PROCEDIA STRUCTURAL INTEGRITY. - ISSN 2452-3216. - ELETTRONICO. - 7:(2017), pp. 335-342. [10.1016/j.prostr.2017.11.097]

Effect of defect size on P-S-N curves in Very-High-Cycle Fatigue

Paolino, Davide S.;Tridello, Andrea;Chiandussi, Giorgio;Rossetto, Massimo
2017

Abstract

It is well-known that internal defects play a key role in the Very-High-Cycle Fatigue (VHCF) response of metallic materials. VHCF failures generally nucleate from internal defects, whose size strongly affects the material strength and life. Therefore, S-N curves in the VHCF regime are defect size dependent and the scatter of fatigue data is significantly influenced by the statistical distribution of the defect size within the material. The present paper proposes an innovative approach for the statistical modeling of Probabilistic-S-N (P-S-N) curves in the VHCF regime. The proposed model considers conditional P-S-N curves that depend on a specific value of the initial defect size. From the statistical distribution of the initial defect size, marginal P-S-N curves are estimated and the effect of the risk-volume on the VHCF response is also modeled. Finally, the paper reports a numerical example that quantitatively illustrates the concepts of conditional and marginal P-S-N curves and that shows the effect of the risk-volume on the VHCF response.
File in questo prodotto:
File Dimensione Formato  
PSI_FDMD2017b.pdf

accesso aperto

Tipologia: 2a Post-print versione editoriale / Version of Record
Licenza: Creative commons
Dimensione 830.86 kB
Formato Adobe PDF
830.86 kB Adobe PDF Visualizza/Apri
Pubblicazioni consigliate

Caricamento pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2694754
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo