Single Event Transients (SETs) are one of the major concern for Flash-based Field Programmable Gate Arrays (FPGAs). In this paper, we propose a new analysis to characterize the SET phenomena within Flash-based FPGAs.
Effective Characterization of Radiation-induced SET on Flash-based FPGAs / Sterpone, Luca; Azimi, Sarah. - ELETTRONICO. - (2017). ((Intervento presentato al convegno Radiation Effects on Components & Systems Conference tenutosi a Geneva, Switzerland nel 2-6 October 2017.
Titolo: | Effective Characterization of Radiation-induced SET on Flash-based FPGAs | |
Autori: | ||
Data di pubblicazione: | 2017 | |
Abstract: | Single Event Transients (SETs) are one of the major concern for Flash-based Field Programmable Ga...te Arrays (FPGAs). In this paper, we propose a new analysis to characterize the SET phenomena within Flash-based FPGAs. | |
Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
File in questo prodotto:
File | Descrizione | Tipologia | Licenza | |
---|---|---|---|---|
RADECS_2017.pdf | RADECS 2017_Final Version | 2. Post-print / Author's Accepted Manuscript | PUBBLICO - Tutti i diritti riservati | Visibile a tuttiVisualizza/Apri |
Utilizza questo identificativo per citare o creare un link a questo documento:
http://hdl.handle.net/11583/2679574
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.