An optimal algorithm for the automatic generation of March tests

Among the different types of algorithms proposed to test random access memories (RAM), March tests have proven to be faster, simpler, regularly structured and linear in complexity. A March test consists of a sequence of March elements, each composed of a sequence of basic read/write operations to be performed on each cell of the memory, in either ascending or descending order, before proceeding to the next memory cell. The complexity of a March test is given by the number of memory operations in all March elements performed on each memory cell. This paper presents an innovative algorithm for the automatic generation of March tests. The proposed approach is able to generate an optimal March test for an unconstrained set of memory faults in very low computation time.