Archivio Istituzionale della RicercaPAGANINI, GIOVANNI
PAGANINI, GIOVANNI
Dipartimento di Automatica e Informatica
036772
Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs
2024 Bernardi, Paolo; Guerriero, Augusto Maria; Insinga, Giorgio; Paganini, Giovanni; Carnevale, Giambattista; Coppetta, Matteo; Mischo, Walter; Ullmann, Rudolf
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip
2022 Bernardi, Paolo; Insinga, Giorgio; Paganini, Giovanni; Cantoro, Riccardo; Beer, Peter; Mautone, Nellina; Scaramuzza, Pierre; Carnevale, Giambattista; Coppetta, Matteo; Ullmann, Rudolf
Industrial best practice: cases of study by automotive chip- makers
2021 Abbati, L. Degli; Ullmann, R.; Paganini, G.; Coppetta, M.; Zaia, L.; Huard, V.; Montfort, O.; Cantoro, R.; Insinga, G.; Venini, F.; Calao, P.; Bernardi, P.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs / Bernardi, P., Guerriero, A.M., Insinga, G., Paganini, G., Carnevale, G., Coppetta, M., Mischo, W., Ullmann, R.. - In: ELECTRONICS. - ISSN 2079-9292. - 13:2(2024). [10.3390/electronics13020303] | 1-gen-2024 | Bernardi, PaoloInsinga, GiorgioPaganini, Giovanni + | electronics-13-00303.pdf |
| Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip / Bernardi, P., Insinga, G., Paganini, G., Cantoro, R., Beer, P., Mautone, N., Scaramuzza, P., Carnevale, G., Coppetta, M., Ullmann, R.. - (2022), pp. 1-6. (IEEE European Test Symposium Barcelona (Spain) 23-27 May 2022) [10.1109/ETS54262.2022.9810445]. | 1-gen-2022 | Paolo BERNARDIGiorgio INSINGAGiovanni PAGANINIRiccardo CANTORO + | Optimized_diagnostic_strategy_for_embedded_memories_of_Automotive_Systems-on-Chip.pdf |
| Industrial best practice: cases of study by automotive chip- makers / Abbati, L.D., Ullmann, R., Paganini, G., Coppetta, M., Zaia, L., Huard, V., Montfort, O., Cantoro, R., Insinga, G., Venini, F., Calao, P., Bernardi, P.. - (2021), pp. 1-6. (2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 06-08 October 2021) [10.1109/DFT52944.2021.9568350]. | 1-gen-2021 | Paganini, G.Cantoro, R.Insinga, G.Venini, F.Calao, P.Bernardi, P. + | Industrial_best_practice_cases_of_study_by_automotive_chip-_makers.pdf |