DARWISH, ALI

DARWISH, ALI  

Dipartimento di Elettronica e Telecomunicazioni  

095235  

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Near-field microwave sensing technology enhanced with machine learning for the non-destructive evaluation of packaged food and beverage products / Darwish, Ali; Ricci, Marco; Tobon Vasquez, Jorge A.; Migliaccio, Claire; Vipiana, Francesca. - In: SCIENTIFIC REPORTS. - ISSN 2045-2322. - STAMPA. - 14:1(2024). [10.1038/s41598-024-62287-6] 1-gen-2024 Ali DarwishJorge A. Tobon VasquezFrancesca Vipiana + Near-field microwave sensing technology enhanced with machine learning for the non-destructive evaluation of packaged food and beverage products.pdf
In-Line Microwave Nondestructive Evaluation of Packaged Food Products via the Support Vector Machine Algorithm / Darwish, A.; Ricci, M.; Zidane, F.; Tobon Vasquez, J. A.; Casu, M. R.; Lanteri, J.; Migliaccio, C.; Vipiana, F.. - ELETTRONICO. - (2023), pp. 343-344. (Intervento presentato al convegno 2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (USNC-URSI) tenutosi a Portland, OR, USA nel 23-28 July 2023) [10.1109/USNC-URSI52151.2023.10237859]. 1-gen-2023 Darwish A.Ricci M.Tobon Vasquez J. A.Casu M. R.Vipiana F. + n_line_Microwave_Nondestructive_Evaluation_of_Packaged_Food_Products_via_the_Support_Vector_Machine_Algorithm_edited.pdfDarwish_In-Line.pdf
Physical Contamination Detection in Food Industry Using Microwave and Machine Learning / Darwish, Ali; Ricci, Marco; Zidane, Flora; Tobon Vasquez, Jorge A.; Casu, Mario R.; Lanteri, Jerome; Migliaccio, Claire; Vipiana, Francesca. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 11:19(2022). [10.3390/electronics11193115] 1-gen-2022 Ali DarwishMarco RicciJorge A. Tobon VasquezMario R. CasuFrancesca Vipiana + electronics-11-03115.pdf