Archivio Istituzionale della RicercaDARWISH, ALI
DARWISH, ALI
Dipartimento di Elettronica e Telecomunicazioni
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Near-field microwave sensing technology enhanced with machine learning for the non-destructive evaluation of packaged food and beverage products
2024 Darwish, Ali; Ricci, Marco; Tobon Vasquez, Jorge A.; Migliaccio, Claire; Vipiana, Francesca
Physical Contamination Detection in Food Industry Using Microwave and Machine Learning
2022 Darwish, Ali; Ricci, Marco; Zidane, Flora; Tobon Vasquez, Jorge A.; Casu, Mario R.; Lanteri, Jerome; Migliaccio, Claire; Vipiana, Francesca
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Near-field microwave sensing technology enhanced with machine learning for the non-destructive evaluation of packaged food and beverage products / Darwish, Ali; Ricci, Marco; Tobon Vasquez, Jorge A.; Migliaccio, Claire; Vipiana, Francesca. - In: SCIENTIFIC REPORTS. - ISSN 2045-2322. - STAMPA. - 14:1(2024). [10.1038/s41598-024-62287-6] | 1-gen-2024 | Ali DarwishJorge A. Tobon VasquezFrancesca Vipiana + | Near-field microwave sensing technology enhanced with machine learning for the non-destructive evaluation of packaged food and beverage products.pdf |
| Physical Contamination Detection in Food Industry Using Microwave and Machine Learning / Darwish, Ali; Ricci, Marco; Zidane, Flora; Tobon Vasquez, Jorge A.; Casu, Mario R.; Lanteri, Jerome; Migliaccio, Claire; Vipiana, Francesca. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 11:19(2022). [10.3390/electronics11193115] | 1-gen-2022 | Ali DarwishMarco RicciJorge A. Tobon VasquezMario R. CasuFrancesca Vipiana + | electronics-11-03115.pdf |