statistiche ricercatore

Nazione	#
US - Stati Uniti d'America	774
IT - Italia	477
SG - Singapore	333
VN - Vietnam	279
CN - Cina	234
RU - Federazione Russa	159
FR - Francia	91
HK - Hong Kong	79
KR - Corea	65
BR - Brasile	64
IN - India	42
BE - Belgio	38
BD - Bangladesh	34
DE - Germania	30
NL - Olanda	30
JP - Giappone	23
GB - Regno Unito	20
IE - Irlanda	19
IL - Israele	17
TH - Thailandia	17
AT - Austria	15
TR - Turchia	14
CA - Canada	13
FI - Finlandia	13
ES - Italia	12
TW - Taiwan	11
MX - Messico	10
PL - Polonia	10
PH - Filippine	9
CH - Svizzera	7
RO - Romania	7
SE - Svezia	6
EC - Ecuador	5
IQ - Iraq	5
UZ - Uzbekistan	5
ID - Indonesia	4
PK - Pakistan	4
AR - Argentina	3
MA - Marocco	3
BG - Bulgaria	2
CL - Cile	2
DZ - Algeria	2
GR - Grecia	2
KE - Kenya	2
LT - Lituania	2
NO - Norvegia	2
PA - Panama	2
TN - Tunisia	2
AM - Armenia	1
AZ - Azerbaigian	1
CF - Repubblica Centrafricana	1
CI - Costa d'Avorio	1
CO - Colombia	1
CZ - Repubblica Ceca	1
GD - Grenada	1
GE - Georgia	1
GH - Ghana	1
IR - Iran	1
JO - Giordania	1
KH - Cambogia	1
LB - Libano	1
LI - Liechtenstein	1
NI - Nicaragua	1
OM - Oman	1
PY - Paraguay	1
SN - Senegal	1
TM - Turkmenistan	1
TT - Trinidad e Tobago	1
UA - Ucraina	1
VE - Venezuela	1
ZA - Sudafrica	1
Totale	3.022

Nome	#
A Web Scraping Algorithm to Improve the Computation of the Maximum Common Subgraph	370
An Experimental Evaluation of Graph Coloring Heuristics on Multi- and Many-Core Architectures	292
An innovative Strategy to Quickly Grade Functional Test Programs	280
Efficiently Computing Maximum Clique of Sparse Graphs with Many-Core Graphical Processing Units	269
A Novel Indirect Methodology based on Execution Traces for Grading Functional Test Programs	256
Smart Heuristics for Maximum Common Subgraph Sub-Estimation in Large Digital Circuits	220
About the correlation between logical identified faulty gates and their layout characteristics	214
Leveraging ATE to optimize System-Level-Test for Multicore Automotive SoCs	212
A Comprehensive Scan Test Cost Model to Optimize the Production of very large SoCs	201
The Multi-Maximum and Quasi-Maximum Common Subgraph Problem	184
Exploring trade-offs in multi-site wafer testing	164
Reporting test programs connectivity in a human-readable format	163
Exploiting the Connectivity metric in test programs generation	153
Improving state-of-the-art vertex sorting algorithms to compute the maximum common induced subgraph	88
Fast Circuit Analysis via Neighborhood-Guided Maximum Common Subgraph	11
Totale	3.077

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2022/2023	69	0	0	5	3	7	12	1	6	9	7	8	11
2023/2024	352	71	28	33	33	33	33	12	17	18	12	16	46
2024/2025	707	28	46	56	65	38	55	52	76	97	31	67	96
2025/2026	1.949	83	194	140	174	126	84	222	159	356	198	95	118
Totale													3.077

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