Archivio Istituzionale della RicercaGIORGIS, FABRIZIO
GIORGIS, FABRIZIO
Dipartimento Scienza Applicata e Tecnologia
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Risultati 1 - 11 di 11 (tempo di esecuzione: 0.018 secondi).
New sensing strategies based on surface modes in photonic crystals
2015 Descrovi, Emiliano; Rivolo, Paola; Boarino, Luca; De Leo, Natascia; Giorgis, Fabrizio
Biomimetic Tailoring of the Surface Properties of Polymers at the Nanoscale: Medical Applications
2011 Chiono, Valeria; Descrovi, Emiliano; Sartori, Susanna; Gentile, Piergiorgio; Ballarini, Mirko; Giorgis, Fabrizio; Ciardelli, Gianluca
Micro-Raman characterization of mc-Si:H films deposited by PECVD, mc-SiC:H deposited by ECR-CVD and 6H-SiC wafers
2002 Ferrero, Sergio; Giorgis, Fabrizio; Pirri, Candido; Mandracci, Pietro; Cicero, Giancarlo; Ricciardi, Carlo
Growth, characterization and physical properties of noncrystalline and nanostructured silicon-based alloys
2001 Giorgis, Fabrizio; Pirri, Candido
GROWTH, CHARACTERIZATION AND PHYSICAL PROPERTIES OF NON-CRYSTALLINE AND NANOSTRUCTURED SILICON-BASED ALLOYS
2000 Giorgis, Fabrizio; Pirri, Candido
Carrier confinement in a-SixN1-x:H multilayer structures for increased light emission
1999 R., Rizzoli; C., Summonte; R., Galloni; A., Desalvo; F., Zignani; R., Pinghini; E., Centurioni; Giorgis, Fabrizio; Pirri, Candido; Tresso, Elena Maria; P., Rava
Information on gap states in a-Si(1-x)N(x):H from ESR, LESR and photothermal deflection spectroscopies
1998 Giorgis, Fabrizio; F., Giuliani; Pirri, Candido; Tresso, Elena Maria
Information on gap states in a-Si(x)C(1-x):H from ESR, LESR, constant photocurrent and photothermal deflection spectroscopies
1998 Giorgis, Fabrizio; F., Giuliani; Pirri, Candido; Tresso, Elena Maria; U., Coscia
Structural information on a-SiC:H from Infrared and Raman spectroscopy
1998 Giorgis, Fabrizio; F., Giuliani; Pirri, Candido; V., Rigato; Tresso, Elena Maria; S., Zandolin
Structural information on a-SiN:H from infrared and Raman spectroscopy
1998 Giorgis, Fabrizio; F., Giuliani; Pirri, Candido; Tresso, Elena Maria
‘Defects' and their detection in a-C and a-C:H
1998 Giorgis, Fabrizio; Tagliaferro, Alberto; Fanciulli, M.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| New sensing strategies based on surface modes in photonic crystals / Descrovi, Emiliano; Rivolo, Paola; Boarino, Luca; De Leo, Natascia; Giorgis, Fabrizio - In: Organic and Hybrid Photonic Crystals / Davide Comoretto. - STAMPA. - [s.l] : Springer, 2015. - ISBN 978-3-319-16579-0. - pp. 321-337 [10.1007/978-3-319-16580-6] | 1-gen-2015 | DESCROVI, EMILIANORIVOLO, PAOLAGIORGIS, FABRIZIO + | - |
| Biomimetic Tailoring of the Surface Properties of Polymers at the Nanoscale: Medical Applications / Chiono, Valeria; Descrovi, Emiliano; Sartori, Susanna; Gentile, Piergiorgio; Ballarini, Mirko; Giorgis, Fabrizio; Ciardelli, Gianluca (NANOSCIENCE AND TECHNOLOGY). - In: Scanning Probe Microscopy in Nanoscience and Nanotechnology Vol. 2STAMPA. - [s.l] : Springer, 2011. - ISBN 978-3-642-10497-8. - pp. 645-689 [10.1007/978-3-642-10497-8_22] | 1-gen-2011 | CHIONO, VALERIADESCROVI, EMILIANOSARTORI, SUSANNAGENTILE, PIERGIORGIOBALLARINI, MIRKOGIORGIS, FABRIZIOCIARDELLI, GIANLUCA | - |
| Micro-Raman characterization of mc-Si:H films deposited by PECVD, mc-SiC:H deposited by ECR-CVD and 6H-SiC wafers / Ferrero, Sergio; Giorgis, Fabrizio; Pirri, Candido; Mandracci, Pietro; Cicero, Giancarlo; Ricciardi, Carlo - In: State of the Art and Future Development in Raman Spectroscopy and Related Techniques / G. MESSINA, S. SANTANGELO. - AMSTERDAM : IOS Press, 2002. - ISBN 9781586032623. - pp. 113-130 | 1-gen-2002 | FERRERO, SERGIOGIORGIS, FABRIZIOPIRRI, CandidoMANDRACCI, PietroCICERO, GiancarloRICCIARDI, Carlo | - |
| Growth, characterization and physical properties of noncrystalline and nanostructured silicon-based alloys / Giorgis, Fabrizio; Pirri, Candido - In: Silicon-based Materials and Devices / Hari Singh Nalwa. - San Diego (USA) : Academic Press, 2001. - ISBN 9780125139182. - pp. 187-235 | 1-gen-2001 | GIORGIS, FABRIZIOPIRRI, Candido | - |
| GROWTH, CHARACTERIZATION AND PHYSICAL PROPERTIES OF NON-CRYSTALLINE AND NANOSTRUCTURED SILICON-BASED ALLOYS / Giorgis, Fabrizio; Pirri, Candido - In: SILICON-BASED MATERIALS AND DEVICES / NALWA H. S.. - SAN DIEGO : academic press, 2000. - pp. 187-235 | 1-gen-2000 | GIORGIS, FABRIZIOPIRRI, Candido | - |
| Carrier confinement in a-SixN1-x:H multilayer structures for increased light emission / R., Rizzoli; C., Summonte; R., Galloni; A., Desalvo; F., Zignani; R., Pinghini; E., Centurioni; Giorgis, Fabrizio; Pirri, Candido; Tresso, Elena Maria; P., Rava - In: Innovative Light Emitting Materials. Advances in Science and Technologies / .. - FAENZA : Techna Editore, 1999. - ISBN 9788886538282. - pp. 67-80 | 1-gen-1999 | GIORGIS, FABRIZIOPIRRI, CandidoTRESSO, Elena Maria + | - |
| Information on gap states in a-Si(1-x)N(x):H from ESR, LESR and photothermal deflection spectroscopies / Giorgis, Fabrizio; F., Giuliani; Pirri, Candido; Tresso, Elena Maria - In: Properties of amorphous silicon and its alloys / T. Searle (ed.). - London : INSPEC, IEE, 1998. - ISBN 0852969228. - pp. 168-173 | 1-gen-1998 | GIORGIS, FABRIZIOPIRRI, CandidoTRESSO, Elena Maria + | - |
| Information on gap states in a-Si(x)C(1-x):H from ESR, LESR, constant photocurrent and photothermal deflection spectroscopies / Giorgis, Fabrizio; F., Giuliani; Pirri, Candido; Tresso, Elena Maria; U., Coscia - In: Properties of amorphous silicon and its alloys / T. Searle (ed.). - London : INSPEC, IEE, 1998. - ISBN 0852969228. - pp. 161-167 | 1-gen-1998 | GIORGIS, FABRIZIOPIRRI, CandidoTRESSO, Elena Maria + | - |
| Structural information on a-SiC:H from Infrared and Raman spectroscopy / Giorgis, Fabrizio; F., Giuliani; Pirri, Candido; V., Rigato; Tresso, Elena Maria; S., Zandolin - In: Properties of amorphous silicon and its alloys / T. Searle (ed.). - London : INSPEC, IEE, 1998. - ISBN 0852969228. - pp. 74-90 | 1-gen-1998 | GIORGIS, FABRIZIOPIRRI, CandidoTRESSO, Elena Maria + | - |
| Structural information on a-SiN:H from infrared and Raman spectroscopy / Giorgis, Fabrizio; F., Giuliani; Pirri, Candido; Tresso, Elena Maria - In: Properties of amorphous silicon and its alloys / T. Searle (ed.). - London : INSPEC, IEE, 1998. - ISBN 0852969228. - pp. 85-94 | 1-gen-1998 | GIORGIS, FABRIZIOPIRRI, CandidoTRESSO, Elena Maria + | - |
| ‘Defects' and their detection in a-C and a-C:H / Giorgis, Fabrizio; Tagliaferro, Alberto; Fanciulli, M. - In: Amorphous carbon: state of the art / SILVA S.R.P.; ROBERTSON J.; MILNE W.I.; AMARATUNGA G.A.J.. - SINGAPORE : World Scientific Publishing, 1998. - ISBN 9789810234492. - pp. 143-162 | 1-gen-1998 | GIORGIS, FABRIZIOTAGLIAFERRO, Alberto + | - |