This work presents an analysis of the noise-shaping effect of offset, drift and low-frequency noise cancellation schemes in measurements. The analysis is carried out in the spectral domain by means of signal processing techniques and the Allan deviation is employed to quantify the achievable resolution or the type A uncertainty component and to compare a number of cancellation schemes.

Spectral and Allan deviation analyses of offset, drift and low-frequency noise cancellation schemes in measurements / Musso, M., Ortolano, M.. - ELETTRONICO. - (2026), pp. 1-2. (2026 Conference on Precision Electromagnetic Measurements (CPEM) Madrid (Spa) 6-11 September 2026) [10.1109/cpem68396.2026.11756503].

Spectral and Allan deviation analyses of offset, drift and low-frequency noise cancellation schemes in measurements

Musso, M.;Ortolano, M.
2026

Abstract

This work presents an analysis of the noise-shaping effect of offset, drift and low-frequency noise cancellation schemes in measurements. The analysis is carried out in the spectral domain by means of signal processing techniques and the Allan deviation is employed to quantify the achievable resolution or the type A uncertainty component and to compare a number of cancellation schemes.
2026
979-8-3315-4683-0
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/3017670