In contemporary times, the increasing complexity of the system poses significant challenges to the reliability, trustworthiness, and security of the Safety-Critical Real-Time Embedded Systems (SACRES). Key issues include the susceptibility to phenomena such as instantaneous voltage spikes, electromagnetic interference, neutron strikes, and out-of-range temperatures. These factors can induce switch state changes in transistors, resulting in bit-flipping, soft errors, and transient corruption of stored data in memory. The occurrence of soft errors, in turn, may lead to system faults that can propel the system into a hazardous state. Particularly in critical sectors like automotive, avionics, or aerospace, such malfunctions can have real-world implications, potentially causing harm to individuals.This paper introduces a fault injector designed with the novelty to facilitate the monitoring, aggregation, and examination of micro-architectural events. This is achieved by harnessing the microprocessor’s Performance Monitoring Unit (PMU) and the debugging interface, explicitly focusing on ensuring the repeatability of fault injections. The fault injection methodology targets bit-flipping within the memory system, affecting CPU registers and RAM. The outcomes of these fault injections enable a thorough analysis of the impact of soft errors in the final output and timing predictability demanded by SACRES.

A Micro Architectural Events Aware Real-Time Embedded System Fault Injector / Magliano, Enrico; Carpegna, Alessio; Savino, Alessandro; DI CARLO, Stefano. - ELETTRONICO. - (2024), pp. 1-6. (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceio (BRA) nel 09-12 April 2024) [10.1109/LATS62223.2024.10534595].

A Micro Architectural Events Aware Real-Time Embedded System Fault Injector

Enrico Magliano;Alessio Carpegna;Alessandro Savino;Stefano Di Carlo
2024

Abstract

In contemporary times, the increasing complexity of the system poses significant challenges to the reliability, trustworthiness, and security of the Safety-Critical Real-Time Embedded Systems (SACRES). Key issues include the susceptibility to phenomena such as instantaneous voltage spikes, electromagnetic interference, neutron strikes, and out-of-range temperatures. These factors can induce switch state changes in transistors, resulting in bit-flipping, soft errors, and transient corruption of stored data in memory. The occurrence of soft errors, in turn, may lead to system faults that can propel the system into a hazardous state. Particularly in critical sectors like automotive, avionics, or aerospace, such malfunctions can have real-world implications, potentially causing harm to individuals.This paper introduces a fault injector designed with the novelty to facilitate the monitoring, aggregation, and examination of micro-architectural events. This is achieved by harnessing the microprocessor’s Performance Monitoring Unit (PMU) and the debugging interface, explicitly focusing on ensuring the repeatability of fault injections. The fault injection methodology targets bit-flipping within the memory system, affecting CPU registers and RAM. The outcomes of these fault injections enable a thorough analysis of the impact of soft errors in the final output and timing predictability demanded by SACRES.
2024
979-8-3503-6555-9
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2989370