Experimental investigations on the tuning of active gate drivers under load current variations

Active Gate Drivers have gained of interest as they allow one to shape the switching waveforms finely, thus reducing overshoots and oscillations. However, when fast power switches are exploited, the tuning of such drivers is still challenging. This paper investigates the adjustment of gate current profile under load variations, which is a crucial issue when targeting practical applications. Indeed, a technique, based on the stretching of time intervals, is proposed and its effectiveness, in terms of undershoot reduction, is experimentally assessed.