Performance in analog integrated circuits strongly depends on the mismatch between nominally identical devices. In this work we derive closed-form asymptotic expressions describing mismatch variance in multifinger structures, under the assumption of Gaussian autocorrelation for the mismatch-generating stochastic process. The analysis is performed on interdigitated geometries, eventually modified to make them common-centroid. Comparison with the numerical results provided by an independent model validates the theoretical expressions presented here.

Asymptotic expressions of mismatch variance in interdigitated geometries / Paolino, C.; Pareschi, F.; Rovatti, R.; Setti, G.. - STAMPA. - 2020:(2020). ((Intervento presentato al convegno 52nd IEEE International Symposium on Circuits and Systems, ISCAS 2020 tenutosi a Seville, Spain (Virtual) nel October 10-21, 2020 [10.1109/ISCAS45731.2020.9181159].

Asymptotic expressions of mismatch variance in interdigitated geometries

Paolino C.;Pareschi F.;Setti G.
2020

Abstract

Performance in analog integrated circuits strongly depends on the mismatch between nominally identical devices. In this work we derive closed-form asymptotic expressions describing mismatch variance in multifinger structures, under the assumption of Gaussian autocorrelation for the mismatch-generating stochastic process. The analysis is performed on interdigitated geometries, eventually modified to make them common-centroid. Comparison with the numerical results provided by an independent model validates the theoretical expressions presented here.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11583/2918016