Archivio Istituzionale della RicercaAn integrated synchronous buck converter, designed in a 0.18-μm high-voltage CMOS technology, is analyzed to investigate the impact of the dead times between the control signals on the radiated emissions. The designed converter enables to set the dead times of the control signals for both integrated or off-chip transistor switches. The test boards are designed to analyze the impact of dead times on radiated emissions for integrated and discrete synchronous buck converter. The radiated emissions of both integrated and discrete converter are measured in a semi-anechoic chamber.
Impact of Dead Times on Radiated Emissions of Integrated and Discrete DC-DC Converter / Bacmaga, J.; Blecic, R.; Pareschi, F.; Setti, G.; Baric, A.. - STAMPA. - (2019), pp. 266-268. (Intervento presentato al convegno 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2019 tenutosi a Hangzhou (China) nel October 21-23, 2019) [10.1109/EMCCompo.2019.8919946].
Impact of Dead Times on Radiated Emissions of Integrated and Discrete DC-DC Converter
Pareschi F.;Setti G.;
2019
Abstract
An integrated synchronous buck converter, designed in a 0.18-μm high-voltage CMOS technology, is analyzed to investigate the impact of the dead times between the control signals on the radiated emissions. The designed converter enables to set the dead times of the control signals for both integrated or off-chip transistor switches. The test boards are designed to analyze the impact of dead times on radiated emissions for integrated and discrete synchronous buck converter. The radiated emissions of both integrated and discrete converter are measured in a semi-anechoic chamber.
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EMC2019-DeadTimes.pdf
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https://hdl.handle.net/11583/2786311