To deal with innovative productions and advanced materials, technological surface characterisation is becoming crucial to qualify components and optimise processes. Instrumented Indentation Test (IIT) is an effective method for materials mechanical characterisation enabling bulk to local characterisation by analysing the force-displacement curve resulting from the application of a loading/unloading indentation cycle. To guarantee accuracy, ISO 14577-2 defines procedures to calibrate testing machines. In particular, iterative methods that do not require the indenter area function to be known a-priori, thus avoiding the need of high resolution microscopes, are exploited for calibrating frame compliance and indenter area function. This work, basing on a Monte Carlo approach for evaluating calibration uncertainty, discusses the results of the comparison of these methods in the nano-range. Standards shortcomings due to effect of calibration materials and algorithms are highlighted as well.

Comparison of calibration methods for nano-indentation testing machines / Maculotti, Giacomo; Genta, Gianfranco; Galetto, Maurizio. - ELETTRONICO. - (2019), pp. 1-10. (Intervento presentato al convegno XIV Convegno dell'Associazione Italiana Tecnologie Manifatturiere tenutosi a Padova nel 9-11 Settembre 2019).

Comparison of calibration methods for nano-indentation testing machines

Giacomo Maculotti;Gianfranco Genta;Maurizio Galetto
2019

Abstract

To deal with innovative productions and advanced materials, technological surface characterisation is becoming crucial to qualify components and optimise processes. Instrumented Indentation Test (IIT) is an effective method for materials mechanical characterisation enabling bulk to local characterisation by analysing the force-displacement curve resulting from the application of a loading/unloading indentation cycle. To guarantee accuracy, ISO 14577-2 defines procedures to calibrate testing machines. In particular, iterative methods that do not require the indenter area function to be known a-priori, thus avoiding the need of high resolution microscopes, are exploited for calibrating frame compliance and indenter area function. This work, basing on a Monte Carlo approach for evaluating calibration uncertainty, discusses the results of the comparison of these methods in the nano-range. Standards shortcomings due to effect of calibration materials and algorithms are highlighted as well.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2751490
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