High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices

High Volt­age Tem­per­a­ture Hu­mid­ity Bias Test (THB-HV) is cur­rently the state of the art test method for re­li­a­bil­ity eval­u­a­tion of power de­vices in high hu­mid­ity en­vi­ron­ments at high volt­age. These con­di­tions have be­come es­pe­cially sig­nif­i­cant in the case of power mod­ules for the au­to­mo­tive in­dus­try and other ap­pli­ca­tions in harsh en­vi­ron­ments. In this re­search work, a cus­tom sys­tem for ac­tive mon­i­tor­ing of THB-HV test­ing is de­vel­oped and cus­tomized, in or­der to eval­u­ate dif­fer­ent test­ing method­olo­gies, in­ter­cept de­vice degra­da­tion in real time, and al­low for a con­trolled and more ac­cu­rate fail­ure analy­sis of the DUTs.

High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices / Cimmino, Davide; Busca, Roberta; Ferrero, Sergio; Pirri, Candido; Giovanni, Richieri; Rossano, Carta. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 100-101:113319(2019), pp. 1-5. [10.1016/j.microrel.2019.06.011]

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Titolo: High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices
Autori: 
CIMMINO, DAVIDE
BUSCA, ROBERTA
FERRERO, SERGIO
PIRRI, Candido
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Data di pubblicazione: 2019
Rivista: 
MICROELECTRONICS RELIABILITY  
Digital Object Identifier (DOI): http://dx.doi.org/10.1016/j.microrel.2019.06.011
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