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BUSCA, ROBERTA
Dipartimento Scienza Applicata e Tecnologia
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Metal and dielectric based materials for power semiconductor performance improvements
2022 Busca, Roberta
Multilayer film passivation for enhanced reliability of power semiconductor devices
2020 Busca, Roberta; Cimmino, Davide; Ferrero, Sergio; Scaltrito, Luciano; Pirri, Candido; Richieri, Giovanni; Carta, Rossano
High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices
2019 Cimmino, Davide; Busca, Roberta; Ferrero, Sergio; Pirri, Candido; Giovanni, Richieri; Rossano, Carta
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Metal and dielectric based materials for power semiconductor performance improvements / Busca, Roberta. - (2022 Feb 16), pp. 1-132. | 16-feb-2022 | BUSCA, ROBERTA | PhD_Thesis_Busca_Roberta.pdf; Abstract_Busca_Roberta.pdf |
| Multilayer film passivation for enhanced reliability of power semiconductor devices / Busca, Roberta; Cimmino, Davide; Ferrero, Sergio; Scaltrito, Luciano; Pirri, Candido; Richieri, Giovanni; Carta, Rossano. - In: JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. B, NANOTECHNOLOGY & MICROELECTRONICS. - ISSN 2166-2746. - ELETTRONICO. - 38:2(2020), p. 022206. [10.1116/1.5121880] | 1-gen-2020 | Busca, RobertaCimmino, DavideFerrero, SergioScaltrito, LucianoPirri, Candido + | JVB19-AR-AIV2019-00274.pdf; 1.5121880.pdf |
| High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices / Cimmino, Davide; Busca, Roberta; Ferrero, Sergio; Pirri, Candido; Giovanni, Richieri; Rossano, Carta. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 100-101:113319(2019), pp. 1-5. [10.1016/j.microrel.2019.06.011] | 1-gen-2019 | CIMMINO, DAVIDEBUSCA, ROBERTASergio FerreroFabrizio Pirri + | ESREF_2019_HV_THB_rev08Cimmino.pdf; 1-s2.0-S0026271419305268-main.pdf |