Archivio Istituzionale della RicercaCIMMINO, DAVIDE
CIMMINO, DAVIDE
Dipartimento Scienza Applicata e Tecnologia
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Enhanced Electrical and Reliability Testing of Power Semiconductor Devices
2021 Cimmino, Davide
High-Voltage Temperature Humidity Bias Test (HV-THB): Overview of Current Test Methodologies and Reliability Performances
2020 Cimmino, Davide; Ferrero, Sergio
Multilayer film passivation for enhanced reliability of power semiconductor devices
2020 Busca, Roberta; Cimmino, Davide; Ferrero, Sergio; Scaltrito, Luciano; Pirri, Candido; Richieri, Giovanni; Carta, Rossano
High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices
2019 Cimmino, Davide; Busca, Roberta; Ferrero, Sergio; Pirri, Candido; Giovanni, Richieri; Rossano, Carta
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Enhanced Electrical and Reliability Testing of Power Semiconductor Devices / Cimmino, Davide. - (2021 Mar 25), pp. 1-150. | 25-mar-2021 | CIMMINO, DAVIDE | Cimmino_PDFA_phd_thesis_final.pdf; Cimmino_PDFA_phd_thesis_final_ABSTRACT.pdf |
| High-Voltage Temperature Humidity Bias Test (HV-THB): Overview of Current Test Methodologies and Reliability Performances / Cimmino, Davide; Ferrero, Sergio. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 9:11(2020). [10.3390/electronics9111884] | 1-gen-2020 | Davide CimminoSergio Ferrero | electronics-09-01884 (1).pdf |
| Multilayer film passivation for enhanced reliability of power semiconductor devices / Busca, Roberta; Cimmino, Davide; Ferrero, Sergio; Scaltrito, Luciano; Pirri, Candido; Richieri, Giovanni; Carta, Rossano. - In: JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. B, NANOTECHNOLOGY & MICROELECTRONICS. - ISSN 2166-2746. - ELETTRONICO. - 38:2(2020), p. 022206. [10.1116/1.5121880] | 1-gen-2020 | Busca, RobertaCimmino, DavideFerrero, SergioScaltrito, LucianoPirri, Candido + | JVB19-AR-AIV2019-00274.pdf; 1.5121880.pdf |
| High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices / Cimmino, Davide; Busca, Roberta; Ferrero, Sergio; Pirri, Candido; Giovanni, Richieri; Rossano, Carta. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 100-101:113319(2019), pp. 1-5. [10.1016/j.microrel.2019.06.011] | 1-gen-2019 | CIMMINO, DAVIDEBUSCA, ROBERTASergio FerreroFabrizio Pirri + | ESREF_2019_HV_THB_rev08Cimmino.pdf; 1-s2.0-S0026271419305268-main.pdf |