CIMMINO, DAVIDE

CIMMINO, DAVIDE  

Dipartimento Scienza Applicata e Tecnologia  

038152  

Mostra records
Risultati 1 - 4 di 4 (tempo di esecuzione: 0.005 secondi).
Citazione Data di pubblicazione Autori File
Enhanced Electrical and Reliability Testing of Power Semiconductor Devices / Cimmino, Davide. - (2021 Mar 25), pp. 1-150. 25-mar-2021 CIMMINO, DAVIDE Cimmino_PDFA_phd_thesis_final.pdfCimmino_PDFA_phd_thesis_final_ABSTRACT.pdf
High-Voltage Temperature Humidity Bias Test (HV-THB): Overview of Current Test Methodologies and Reliability Performances / Cimmino, Davide; Ferrero, Sergio. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 9:11(2020). [10.3390/electronics9111884] 1-gen-2020 Davide CimminoSergio Ferrero electronics-09-01884 (1).pdf
Multilayer film passivation for enhanced reliability of power semiconductor devices / Busca, Roberta; Cimmino, Davide; Ferrero, Sergio; Scaltrito, Luciano; Pirri, Candido; Richieri, Giovanni; Carta, Rossano. - In: JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. B, NANOTECHNOLOGY & MICROELECTRONICS. - ISSN 2166-2746. - ELETTRONICO. - 38:2(2020), p. 022206. [10.1116/1.5121880] 1-gen-2020 Busca, RobertaCimmino, DavideFerrero, SergioScaltrito, LucianoPirri, Candido + JVB19-AR-AIV2019-00274.pdf1.5121880.pdf
High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices / Cimmino, Davide; Busca, Roberta; Ferrero, Sergio; Pirri, Candido; Giovanni, Richieri; Rossano, Carta. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 100-101:113319(2019), pp. 1-5. [10.1016/j.microrel.2019.06.011] 1-gen-2019 CIMMINO, DAVIDEBUSCA, ROBERTASergio FerreroFabrizio Pirri + ESREF_2019_HV_THB_rev08Cimmino.pdf1-s2.0-S0026271419305268-main.pdf