We propose a numerically efficient technique for the mixed-mode physics-based variability analysis of microwave circuits undergoing concurrent variations in the active device and in the external passive network, allowing for a direct link between the spread of nonlinear circuit performances and the variability of technological parameters. The new technique has been validated against repeated physical load-pull simulations of a class AB power amplifier with random variations of the active device gate length and of the external load, showing an excellent precision and a massive reduction of simulation time.
A comprehensive technique for the assessment of microwave circuit design variability through physical simulations / DONATI GUERRIERI, Simona; Bonani, Fabrizio; Ghione, Giovanni. - STAMPA. - 2017 International Microwave Symposium (IMS)(2017), pp. 1791-1794. ((Intervento presentato al convegno 2017 International Microwave Symposium (IMS) tenutosi a Honolulu (USA) nel 4-9 June 2017 [10.1109/MWSYM.2017.8058996].
Titolo: | A comprehensive technique for the assessment of microwave circuit design variability through physical simulations | |
Autori: | ||
Data di pubblicazione: | 2017 | |
Abstract: | We propose a numerically efficient technique for the mixed-mode physics-based variability analysi...s of microwave circuits undergoing concurrent variations in the active device and in the external passive network, allowing for a direct link between the spread of nonlinear circuit performances and the variability of technological parameters. The new technique has been validated against repeated physical load-pull simulations of a class AB power amplifier with random variations of the active device gate length and of the external load, showing an excellent precision and a massive reduction of simulation time. | |
ISBN: | 978-1-5090-6360-4 978-1-5090-6361-1 | |
Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
File in questo prodotto:
File | Descrizione | Tipologia | Licenza | |
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IMS 17.pdf | Articolo principale | 2. Post-print / Author's Accepted Manuscript | Non Pubblico - Accesso privato/ristretto | Administrator Richiedi una copia |
http://hdl.handle.net/11583/2684630