It is well-known in the literature that internal defects play a major role in the Very-High-Cycle Fatigue (VHCF) response of metallic materials. Generally, VHCF failures nucleate from internal defects characterized by a limited size. Unexpectedly, it has been found that cracks can grow from the initial defect even if the Stress Intensity Factor (SIF) is quite below the characteristic threshold for crack growth. Even though researchers unanimously accept this singular experimental evidence, they still dispute about its physical justification. Different micromechanical explanations have been proposed in the literature: local grain refinement, carbide decohesion, matrix fragmentation, hydrogen embrittlement, numerous cyclic pressure and formation of persistent slip bands are the most famous proposals. Regardless of the specific micromechanical explanation, it is generally acknowledged that a weakening mechanism occurs around the initial defect, thus permitting crack growth below the SIF threshold. The present paper proposes an innovative approach for the quantitative modeling of the weakening process around the initial defect. The proposed model considers an additional SIF that reduces the SIF threshold of the material. Starting from a very general formulation for the additional SIF, possible scenarios for crack growth from the initial defect are also identified and described. It is theoretically demonstrated that, depending on the scenario, a VHCF limit may also be present and its final formulation recalls the well-known expression previously proposed by Murakami.
|Titolo:||A general model for crack growth from initial defect in Very-High-Cycle Fatigue|
|Data di pubblicazione:||2017|
|Digital Object Identifier (DOI):||10.1016/j.prostr.2017.04.069|
|Appare nelle tipologie:||1.1 Articolo in rivista|