NAND Flash memories are gaining popularity in the development of electronic embedded systems for both consumer and mission-critical applications. NAND Flashes crucially influence computing systems development and performances. EF3S, a framework to easily assess NAND Flash based memory systems performances (reliability, throughput, power), is presented. The framework is based on a simulation engine and a running environment which enable developers to assess any application impact. Experimental results show functionality of the framework, analysing several performance-reliability tradeoffs of an illustrative system.

Ef3S: An evaluation framework for flash-based systems / DI CARLO, Stefano; Galfano, Salvatore; Indaco, Marco; Prinetto, Paolo Ernesto. - STAMPA. - (2013), pp. 199-204. (Intervento presentato al convegno IEEE 19th International On-Line Testing Symposium (IOLTS) tenutosi a Crete, GR nel 8-10 July, 2013) [10.1109/IOLTS.2013.6604079].

Ef3S: An evaluation framework for flash-based systems

DI CARLO, STEFANO;GALFANO, SALVATORE;INDACO, MARCO;PRINETTO, Paolo Ernesto
2013

Abstract

NAND Flash memories are gaining popularity in the development of electronic embedded systems for both consumer and mission-critical applications. NAND Flashes crucially influence computing systems development and performances. EF3S, a framework to easily assess NAND Flash based memory systems performances (reliability, throughput, power), is presented. The framework is based on a simulation engine and a running environment which enable developers to assess any application impact. Experimental results show functionality of the framework, analysing several performance-reliability tradeoffs of an illustrative system.
2013
9781479906642
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2518963
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