NAND Flash memories are gaining popularity in the development of electronic embedded systems for both consumer and mission-critical applications. NAND Flashes crucially influence computing systems development and performances. EF3S, a framework to easily assess NAND Flash based memory systems performances (reliability, throughput, power), is presented. The framework is based on a simulation engine and a running environment which enable developers to assess any application impact. Experimental results show functionality of the framework, analysing several performance-reliability tradeoffs of an illustrative system.
Ef3S: An evaluation framework for flash-based systems / DI CARLO, Stefano; Galfano, Salvatore; Indaco, Marco; Prinetto, Paolo Ernesto. - STAMPA. - (2013), pp. 199-204. (Intervento presentato al convegno IEEE 19th International On-Line Testing Symposium (IOLTS) tenutosi a Crete, GR nel 8-10 July, 2013) [10.1109/IOLTS.2013.6604079].
Ef3S: An evaluation framework for flash-based systems
DI CARLO, STEFANO;GALFANO, SALVATORE;INDACO, MARCO;PRINETTO, Paolo Ernesto
2013
Abstract
NAND Flash memories are gaining popularity in the development of electronic embedded systems for both consumer and mission-critical applications. NAND Flashes crucially influence computing systems development and performances. EF3S, a framework to easily assess NAND Flash based memory systems performances (reliability, throughput, power), is presented. The framework is based on a simulation engine and a running environment which enable developers to assess any application impact. Experimental results show functionality of the framework, analysing several performance-reliability tradeoffs of an illustrative system.File | Dimensione | Formato | |
---|---|---|---|
2013-IOLTS-EF3S-AuthorVersion.pdf
accesso aperto
Descrizione: Author Version
Tipologia:
1. Preprint / submitted version [pre- review]
Licenza:
PUBBLICO - Tutti i diritti riservati
Dimensione
420.16 kB
Formato
Adobe PDF
|
420.16 kB | Adobe PDF | Visualizza/Apri |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/2518963
Attenzione
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo