Ultra Deep Sub-Micron (UDSM) processes, as well as beyond CMOS technology choices, influence circuits performance with a chain of consequences through devices, circuits and systems that are difficult to predict. Nonetheless effective design-space exploration enables process optimization and early design organization. We introduce TAMTAMS, a tool based on an open, flexible and simple structure, which allows to predict system level features starting from technology variables. It is modular and based on a clear dependency tree of modules, each related to a model of specific quantities (e.g. device currents, circuit delay, interconnects noise, ....) presented in literature. Models can be compared and sensitivity to parameters observed. We believe our contribution gives a fresh point of view on process-to-system predictors. Though still in development, it already shows flexibility and allows a traceable path of a technology parameter on its way to the system level.
TAMTAMS: a flexible and open tool for UDSM process-to-system design space exploration / Vacca, Marco; Graziano, Mariagrazia; Demarchi, Danilo; Piccinini, Gianluca. - STAMPA. - 1:(2012), pp. 180-183. (Intervento presentato al convegno 13th International Conference on Ultimate Integration on Silicon (ULIS), 2012 tenutosi a Grenoble, France nel 6-7 March 2012) [10.1109/ULIS.2012.6193377].
TAMTAMS: a flexible and open tool for UDSM process-to-system design space exploration
VACCA, MARCO;GRAZIANO, MARIAGRAZIA;DEMARCHI, DANILO;PICCININI, GIANLUCA
2012
Abstract
Ultra Deep Sub-Micron (UDSM) processes, as well as beyond CMOS technology choices, influence circuits performance with a chain of consequences through devices, circuits and systems that are difficult to predict. Nonetheless effective design-space exploration enables process optimization and early design organization. We introduce TAMTAMS, a tool based on an open, flexible and simple structure, which allows to predict system level features starting from technology variables. It is modular and based on a clear dependency tree of modules, each related to a model of specific quantities (e.g. device currents, circuit delay, interconnects noise, ....) presented in literature. Models can be compared and sensitivity to parameters observed. We believe our contribution gives a fresh point of view on process-to-system predictors. Though still in development, it already shows flexibility and allows a traceable path of a technology parameter on its way to the system level.File | Dimensione | Formato | |
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https://hdl.handle.net/11583/2497964
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