The incessant progress in manufacturing technology is posing new challenges to microprocessor designers. Several activities that were originally supposed to be part of the pre-silicon design phase are migrating after tape-out, when the first silicon prototypes are available. The paper describes a post-silicon methodology for devising functional failing tests. Therefore, suited to be exploited by microprocessor producer to detect, analyze and debug speed paths during verification, speed-stepping, or other critical activities. The proposed methodology is based on an evolutionary algorithm and exploits a versatile toolkit named µGP. The paper describes how to take into account complex hardware characteristics and architectural details of such complex devices. The experimental evaluation clearly demonstrates the potential of this line of research.

Post-silicon failing-test generation through evolutionary computation / SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Tonda, ALBERTO PAOLO. - STAMPA. - (2011), pp. 164-167. ((Intervento presentato al convegno VLSI and System-on-Chip (VLSI-SoC) [10.1109/VLSISoC.2011.6081667].

Post-silicon failing-test generation through evolutionary computation

SANCHEZ SANCHEZ, EDGAR ERNESTO;SQUILLERO, Giovanni;TONDA, ALBERTO PAOLO
2011

Abstract

The incessant progress in manufacturing technology is posing new challenges to microprocessor designers. Several activities that were originally supposed to be part of the pre-silicon design phase are migrating after tape-out, when the first silicon prototypes are available. The paper describes a post-silicon methodology for devising functional failing tests. Therefore, suited to be exploited by microprocessor producer to detect, analyze and debug speed paths during verification, speed-stepping, or other critical activities. The proposed methodology is based on an evolutionary algorithm and exploits a versatile toolkit named µGP. The paper describes how to take into account complex hardware characteristics and architectural details of such complex devices. The experimental evaluation clearly demonstrates the potential of this line of research.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2464582
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