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EnglishIn spite of the mature cell structure, the memory controller architecture of Multi-level cell (MLC) NAND Flash memories is evolving fast in an attempt to improve the uncorrected/miscorrected bit error rate (UBER) and to provide a more flexible usage model where the performance-reliability trade-off point can be adjusted at runtime. However, optimization techniques in the memory controller architecture cannot avoid a strict trade-off between UBER and read throughput. In this paper, we show that co-optimizing ECC architecture configuration in the memory controller with program algorithm selection at the technology layer, a more flexible memory sub-system arises, which is capable of unprecedented trade-offs points between performance and reliability.
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories / Zambelli, C.; Indaco, Marco; Fabiano, Michele; Di Carlo, Stefano; Prinetto, Paolo Ernesto; Olivo, P.; Bertozzi, D.. - ELETTRONICO. - (2012), pp. 881-886. ((Intervento presentato al convegno Design, Automation and Test in Europe, Conference and Exhibition (DATE) tenutosi a Dresden, DE nel 12-16 March 2012.
| Titolo: | A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories | |
| Autori: | ||
| Data di pubblicazione: | 2012 | |
| Abstract: | In spite of the mature cell structure, the memory controller architecture of Multi-level cell (ML...C) NAND Flash memories is evolving fast in an attempt to improve the uncorrected/miscorrected bit error rate (UBER) and to provide a more flexible usage model where the performance-reliability trade-off point can be adjusted at runtime. However, optimization techniques in the memory controller architecture cannot avoid a strict trade-off between UBER and read throughput. In this paper, we show that co-optimizing ECC architecture configuration in the memory controller with program algorithm selection at the technology layer, a more flexible memory sub-system arises, which is capable of unprecedented trade-offs points between performance and reliability. | |
| ISBN: | 9781457721458 | |
| Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
File in questo prodotto:
| File | Descrizione | Tipologia | Licenza | |
|---|---|---|---|---|
| 2012-DATE-Flash-AuthorVersion.pdf | Manuscript author version | 2. Post-print / Author's Accepted Manuscript | PUBBLICO - Tutti i diritti riservati | Visibile a tuttiVisualizza/Apri |
| 2012-DATE-Flash.pdf | 2a Post-print versione editoriale / Version of Record | Non Pubblico - Accesso privato/ristretto | Administrator Richiedi una copia |
http://hdl.handle.net/11583/2462376
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