The continuos shrinking of semiconductor’s nodes makes semiconductor memories increasingly prone to electrical defects tightly related to the internal structure of the memory. Exploring the effect of fabrication defects in future technologies, and identifying new classes of functional fault models with their corresponding test sequences, is a time consuming task up to now mainly performed by hand. This paper pro- poses a new approach to automate this procedure exploiting a dedicated genetic algorithm.

Genetic Defect Based March Test Generation for SRAM / DI CARLO, Stefano; Politano, GIANFRANCO MICHELE MARIA; Prinetto, Paolo Ernesto; Savino, Alessandro; Scionti, A.. - STAMPA. - 6625:(2011), pp. 141-150. (Intervento presentato al convegno EvoCOMNET, EvoFIN, EvoHOT, EvoMUSART, EvoSTIM, and EvoTRANSLOG, EvoApplications 2011 tenutosi a Torino (IT) nel April 27-29 2011) [10.1007/978-3-642-20520-0_15].

Genetic Defect Based March Test Generation for SRAM

DI CARLO, STEFANO;POLITANO, GIANFRANCO MICHELE MARIA;PRINETTO, Paolo Ernesto;SAVINO, ALESSANDRO;
2011

Abstract

The continuos shrinking of semiconductor’s nodes makes semiconductor memories increasingly prone to electrical defects tightly related to the internal structure of the memory. Exploring the effect of fabrication defects in future technologies, and identifying new classes of functional fault models with their corresponding test sequences, is a time consuming task up to now mainly performed by hand. This paper pro- poses a new approach to automate this procedure exploiting a dedicated genetic algorithm.
2011
9783642205194
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2387854
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