Archivio Istituzionale della RicercaTest coverage evaluation is one of the most critical issues in microprocessor software-based testing. Whenever the test is developed in the absence of a structural model of the microprocessor, the evaluation of the final test coverage may become a major issue. In this paper, we present a microprocessor modeling technique based on entity-relationship diagrams allowing the definition and the computation of custom coverage functions. The proposed model is very flexible and particularly effective when a structural model of the microprocessor is not available.
Using ER Models for Microprocessor Functional Test Coverage Evaluation / Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Savino, Alessandro; Scionti, A.. - STAMPA. - (2008), pp. 139-142. (Intervento presentato al convegno IEEE 11th International Biennial Baltic Electronics Conference (BEC) tenutosi a Tallinn, EE nel 6-8 Oct. 2008) [10.1109/BEC.2008.4657498].
Using ER Models for Microprocessor Functional Test Coverage Evaluation
BENSO, Alfredo;DI CARLO, STEFANO;PRINETTO, Paolo Ernesto;SAVINO, ALESSANDRO;
2008
Abstract
Test coverage evaluation is one of the most critical issues in microprocessor software-based testing. Whenever the test is developed in the absence of a structural model of the microprocessor, the evaluation of the final test coverage may become a major issue. In this paper, we present a microprocessor modeling technique based on entity-relationship diagrams allowing the definition and the computation of custom coverage functions. The proposed model is very flexible and particularly effective when a structural model of the microprocessor is not available.
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https://hdl.handle.net/11583/1870166
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