Chip-level failure detection has been a target of research for some time, but today's very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today's chips. This article introduces a self-repair-solution for the digital FIR filter, one of the key blocks used in DSPs.
|Titolo:||Online self-repair of FIR filters|
|Data di pubblicazione:||2003|
|Digital Object Identifier (DOI):||10.1109/MDT.2003.1198686|
|Appare nelle tipologie:||1.1 Articolo in rivista|